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W

Won Hee Jeong

Yonsei University

4H指数
13论文数
109被引数
收录论文 8
发表时间
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A tellurium-free GeSbSe thin film for reliable selector-only memory operation一种无碲的GeSbSe薄膜，用于可靠的仅选择器存储器操作
errmater. horiz.
IF0
err2026-04-07
err0
errOAAI
errInchan Oh †; Won Hee Jeong †; Jaeho Jung; Min Kyu Yang; Gun Hwan Kim
err分享
err收藏
Corrigendum to “Compositional engineering for oxidation-induced drift suppression in GeSbSeTe-based selector-only memory devices” [Appl. Surf. Sci. 733 (2026) 166616]勘误表：针对“用于抑制氧化诱导漂移的GeSbSeTe基选择器-only存储器件的组分工程” [Appl. Surf. Sci. 733 (2026) 166616]
errApplied Surface Science
IF6.9
err2026-03-29
err0
PREAI
errJaeho Jung; Won Hee Jeong; Min Kyu Yang; Gun Hwan Kim
err分享
err收藏
Compositional engineering for oxidation-induced drift suppression in GeSbSeTe-based selector-only memory devices通过组分工程抑制GeSbSeTe基选择器存储器件中的氧化诱导漂移
errApplied Surface Science
IF6.9
err2026-03-16
err0
PREAI
errJaeho Jung; Won Hee Jeong; Min Kyu Yang; Gun Hwan Kim
err分享
err收藏
Selector-only-memory device using chalcogenide thin film in a 4k crossbar array仅含选择器的存储器件，采用硫属化合物薄膜在4k交叉阵列中
errMaterials Science and Engineering: R: Reports
IF0
err2025-12-19
err0
PREAI
errHyun Kyu Seo; Won Hee Jeong; Jaeho Jung; Min Hyuk Park; Gun Hwan Kim; Min Kyu Yang
err分享
err收藏
Effect of Indium Doping on the Reliability Characteristics of Chalcogenide GeSbSeTe Thin-Film-Based Selector-Only Memory Devices
errACS Applied Materials and Interfaces
IF8.2
err2025-12-01
err0
PREAI
errJeong, Won Hee; Lee, Soo Hyun; Kim, Gun Hwan
err分享
err收藏
In-doped GeSbSeTe thin films for increased memory window of selector-only-memory devicesIn掺杂的GeSbSeTe薄膜用于提高选择器仅存器件的记忆窗口
errJOURNAL OF ALLOYS AND COMPOUNDS
IF6.3
err2025-06-01
err0
PREAI
errJeong, Won Hee; Jung, Jaeho; Jeong, Jae-Seung; Yang, Min Kyu
err分享
err收藏
Effect of Ag Concentration Dispersed in HfOx Thin Films on Threshold Switching
errNANOSCALE RESEARCH LETTERS
IF4.1
err2020-01-30
err21
errOAAI
errJeong, Won Hee; Han, Jeong Hwan; Choi, Byung Joon
err分享
err收藏
Trap-Controlled Multi-Level Switching in In-Doped GeSbSe for Selector-Only MemoryIn-Ga-Sb-Te基相变存储器的可扩展性和可靠性研究
errACS Applied Materials & Interfaces
IF0
err
err0
PREAI
errWon Hee Jeong; Min Kyu Yang; Gun Hwan Kim
err分享
err收藏

研究方向

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合作学者
合作期刊
M
Min Hyuk Park
H 指数: 59 · 论文数: 194
B
Byung Joon Choi
H 指数: 37 · 论文数: 197
M
Min Yang
H 指数: 34 · 论文数: 174
G
Gun Hwan Kim
H 指数: 32 · 论文数: 117
J
Jeong Hwan Han
H 指数: 31 · 论文数: 178
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