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J

Jae Wan Kim

korea research institute of standards & science (kriss)

0H指数
0论文数
0被引数
收录论文 5
发表时间
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Absolute Planar Position and Full Angle Orientation Sensor Using a 2-D Color-Coded Binary Scale
errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2020-05-01
err7
PREAI
errKim, Jong-Ahn; Kim, Jae Wan; Kang, Chu-Shik; Lee, Jae Yong; Woo, Jae Heun
err分享
err收藏
Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers
errOPTICS EXPRESS
IF3.3
err2014-09-17
err27
errOAAI
errJin, Jonghan; Maeng, Saerom; Park, Jungjae; Kim, Jong-Ahn; Kim, Jae Wan
err分享
err收藏
Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process
errOPTICS EXPRESS
IF3.3
err2012-02-14
err31
errOAAI
errJin, Jonghan; Kim, Jae Wan; Kang, Chu-Shik; Kim, Jong-Ahn; Lee, Sunghun
err分享
err收藏
An optical simulation algorithm based on ray tracing technique for light absorption in thin film solar cells
errSOLAR ENERGY MATERIALS AND SOLAR CELLS
IF6.3
err2011-01-01
err14
PREAI
errByun, Seok-Joo; Byun, Seok Yong; Lee, Jangkyo; Kim, Jae Wan; Lee, Taek Sung; Kim, Won Mok; Park, Young Kyu; Cho, Kyuman
err分享
err收藏
Visibility enhanced interferometer based on an injection-locking technique for low reflective materials
errOPTICS EXPRESS
IF3.3
err2010-10-25
err3
errOAAI
errJin, Jonghan; Kim, Jae Wan; Kang, Chu-Shik; Kim, Jong-Ahn
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
Y
Young Kyu Park
H 指数: 36 · 论文数: 175
S
Sunghun Lee
H 指数: 31 · 论文数: 167
J
Jonghan Jin
H 指数: 23 · 论文数: 142
C
Chu-Shik Kang
H 指数: 22 · 论文数: 118
K
Kyuman Cho
H 指数: 21 · 论文数: 152
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