未登录Toward Developing Techniques-Agnostic Machine Learning Classification Models for Forensically Relevant Glass Fragments
Kaspi, Omer; Israelsohn-Azulay, Osnat; Yigal, Zidon; Rosengarten, Hila; Krmpotic, Matea; Gouasmia, Sabrina; Radovic, Iva Bogdanovic; Jalkanen, Pasi; Liski, Anna; Mizohata, Kenichiro; Raisanen, Jyrki; Kasztovszky, Zsolt; Harsanyi, Ildiko; Acharya, Raghunath; Pujari, Pradeep K. .; Mihaly, Molnar; Braun, Mihaly; Shabi, Nahum; Girshevitz, Olga; Senderowitz, Hanoch .png)
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收藏分享 收藏 Atomic Layer Deposition of PbS Thin Films at Low Temperatures低温下PbS薄膜的原子层沉积Popov, Georgi; Bacic, Goran; Mattinen, Miika; Manner, Toni; Lindstrom, Hannu; Seppanen, Heli; Suihkonen, Sami; Vehkamaki, Marko; Kemell, Marianna; Jalkanen, Pasi; Mizohata, Kenichiro; Raisanen, Jyrki; Leskela, Markku; Koivula, Hanna Maarit; Barry, Sean T.; Ritala, Mikko 分享 收藏 分享 收藏 Atomic Layer Deposition of Emerging 2D Semiconductors, HfS2 and ZrS2, for Optoelectronics用于光电子的新兴2D半导体HfS2和ZrS2的原子层沉积Mattinen, Miika; Popov, Georgi; Vehkamaki, Marko; King, Peter J.; Mizohata, Kenichiro; Jalkanen, Pasi; Raisanen, Jyrki; Leskela, Markku; Ritala, Mikko 分享 收藏 分享 收藏 Atomic Layer Deposition of Photoconductive Cu2O Thin Films光导Cu2O薄膜的原子层沉积Iivonen, Tomi; Heikkila, Mikko J.; Popov, Georgi; Nieminen, Heta-Elisa; Kaipio, Mikko; Kemell, Marianna; Mattinen, Miika; Meinander, Kristoffer; Mizohata, Kenichiro; Raisanen, Jyrki; Ritala, Mikko; Leskela, Markku 分享 收藏 分享 收藏 分享 收藏 分享 收藏 分享 收藏 分享 收藏 Atomic Layer Deposition of Molybdenum and Tungsten Oxide Thin Films Using Heteroleptic Imido-Amidinato Precursors: Process Development, Film Characterization, and Gas Sensing Properties使用杂配亚氨基脒基前体的钼和氧化钨薄膜的原子层沉积: 工艺开发，薄膜表征和气敏特性Mattinen, Miika; Wree, Jan-Lucas; Stegmann, Niklas; Ciftyurek, Engin; El Achhab, Mhamed; King, Peter J.; Mizohata, Kenichiro; Raisanen, Jyrki; Schierbaum, Klaus D.; Devi, Anjana; Ritala, Mikko; Leskela, Markku 分享 收藏 Atomic Layer Deposition of Intermetallic Co3Sn2 and Ni3Sn2 Thin FilmsVayrynen, Katja; Hatanpaa, Timo; Mattinen, Miika; Mizohata, Kenichiro; Meinander, Kristoffer; Raisanen, Jyrki; Link, Joosep; Stern, Raivo; Ritala, Mikko; Leskela, Markku 分享 收藏 Atomic layer deposition of crystalline molybdenum oxide thin films and phase control by post-deposition annealingMattinen, Miika; King, Peter J.; Khriachtchev, Leonid; Heikkila, Mikko J.; Fleming, Ben; Rushworth, Simon; Mizohata, Kenichiro; Meinander, Kristoffer; Raisanen, Jyrki; Ritala, Mikko; Leskela, Markku 分享 收藏 分享 收藏 分享 收藏 分享 收藏 分享 收藏 Plasma-wall interaction studies within the EUROfusion consortium: progress on plasma-facing components development and qualificationBrezinsek, S.; Coenen, J. W.; Schwarz-Selinger, T.; Schmid, K.; Kirschner, A.; Hakola, A.; Tabares, F. L.; van der Meiden, H. J.; Mayoral, M. -L.; Reinhart, M.; Tsitrone, E.; Ahlgren, T.; Aints, M.; Airila, M.; Almaviva, S.; Alves, E.; Angot, T.; Anita, V.; Parra, R. Arredondo; Aumayr, F.; Balden, M.; Bauer, J.; Ben Yaala, M.; Berger, B. M.; Bisson, R.; Bjorkas, C.; Radovic, I. Bogdanovic; Borodin, D.; Bucalossi, J.; Butikova, J.; Butoi, B.; Cadez, I.; Caniello, R.; Caneve, L.; Cartry, G.; Catarino, N.; Cekada, M.; Ciraolo, G.; Ciupinski, L.; Colao, F.; Corre, Y.; Costin, C.; Craciunescu, T.; Cremona, A.; De Angeli, M.; de Castro, A.; Dejarnac, R.; Dellasega, D.; Dinca, P.; Dittmar, T.; Dobrea, C.; Hansen, P.; Drenik, A.; Eich, T.; Elgeti, S.; Falie, D.; Fedorczak, N.; Ferro, Y.; Fornal, T.; Fortuna-Zalesna, E.; Gao, L.; Gasior, P.; Gherendi, M.; Ghezzi, F.; Gosar, Z.; Greuner, H.; Grigore, E.; Grisolia, C.; Groth, M.; Gruca, M.; Grzonka, J.; Gunn, J. P.; Hassouni, K.; Heinola, K.; Hoeschen, T.; Huber, S.; Jacob, W.; Jepu, I.; Jiang, X.; Jogi, I.; Kaiser, A.; Karhunen, J.; Kelemen, M.; Koeppen, M.; Koslowski, H. R.; Kreter, A.; Kubkowska, M.; Laan, M.; Laguardia, L.; Lahtinen, A.; Lasa, A.; Lazic, V.; Lemahieu, N.; Likonen, J.; Linke, J.; Litnovsky, A.; Linsmeier, Ch.; Loewenhoff, T.; Lungu, C.; Lungu, M.; Maddaluno, G.; Maier, H.; Makkonen, T.; Manhard, A.; Marandet, Y.; Markelj, S.; Marot, L.; Martin, C.; Martin-Rojo, A. B.; Martynova, Y.; Mateus, R.; Matveev, D.; Mayer, M.; Meisl, G.; Mellet, N.; Michau, A.; Miettunen, J.; Moeller, S.; Morgan, T. W.; Mougenot, J.; Mozetic, M.; Nemanic, V.; Neu, R.; Nordlund, K.; Oberkofler, M.; Oyarzabal, E.; Panjan, M.; Pardanaud, C.; Paris, P.; Passoni, M.; Pegourie, B.; Pelicon, P.; Petersson, P.; Piip, K.; Pintsuk, G.; Pompilian, G. O.; Popa, G.; Porosnicu, C.; Primc, G.; Probst, M.; Raisanen, J.; Rasinski, M.; Ratynskaia, S.; Reiser, D.; Ricci, D.; Richou, M.; Riesch, J.; Riva, G.; Rosinski, M.; Roubin, P.; Rubel, M.; Ruset, C.; Safi, E.; Sergienko, G.; Siketic, Z.; Sima, A.; Spilker, B.; Stadlmayr, R.; Steudel, I.; Stroem, P.; Tadic, T.; Tafalla, D.; Tale, I.; Terentyev, D.; Terra, A.; Tiron, V.; Tiseanu, I.; Tolias, P.; Tskhakaya, D.; Uccello, A.; Unterberg, B.; Uytdenhoven, I.; Vassallo, E.; Vavpetic, P.; Veis, P.; Velicu, I. L.; Vernimmen, J. W. M.; Voitkans, A.; von Toussaint, U.; Weckmann, A.; Wirtz, M.; Zaloznik, A.; Zaplotnik, R. 分享 收藏 
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