H. Ryssel - Publications, H-index & Citations

H. Ryssel

fraunhofer gesellschaft

37H指数

574论文数

6.4K被引数

收录论文 24

发表时间

Nondestructive analytical tools for characterization of thin titanium silicide films prepared by conventional and direct step silicidation with enhanced transition

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2019-12-06

PREAI

Kal, S; Ryssel, H

Conduction Mechanisms and Environmental Sensitivity of Solution-Processed Silicon Nanoparticle Layers for Thin-Film Transistors

SMALL

IF12.1

2011-08-22

PREAI

Weis, Sebastian; Koermer, Richard; Jank, Michael P. M.; Lemberger, Martin; Otto, Michael; Ryssel, Heiner; Peukert, Wolfgang; Frey, Lothar

A novel PWM control for a bi-directional full-bridge DC-DC converter with smooth conversion mode transitions

INTERNATIONAL JOURNAL OF ELECTRONICS

IF1.1

2011-08-01

OAAI

Lorentz, V. R. H.; Schwarzmann, H.; Maerz, M.; Bauer, A. J.; Ryssel, H.; Frey, L.; Poure, P.; Braun, F.

Aerosol synthesis of silicon nanoparticles with narrow size distribution-Part 1: Experimental investigations

JOURNAL OF AEROSOL SCIENCE

IF2.9

2010-11-01

PREAI

Koermer, R.; Jank, M. P. M.; Ryssel, H.; Schmid, H. -J.; Peukert, W.

Effective work function tuning in high-κ dielectric metal-oxide-semiconductor stacks by fluorine and lanthanide doping

APPLIED PHYSICS LETTERS

IF3.6

2010-02-04

PREAI

Fet, A.; Haeublein, V.; Bauer, A. J.; Ryssel, H.; Frey, L.

Lossless average inductor current sensor for CMOS integrated DC-DC converters operating at high frequencies

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING

IF1.4

2009-08-19

PREAI

Lorentz, V. R. H.; Berberich, S. E.; Maerz, M.; Bauer, A. J.; Ryssel, H.; Poure, P.; Braun, F.

Segregation of antimony to Si/SiO2 interfaces

MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS

IF4.6

2008-12-01

PREAI

Steen, C.; Pichler, P.; Ryssel, H.

Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics

APPLIED PHYSICS LETTERS

IF3.6

2008-06-27

OAAI

Yanev, Vasil; Rommel, Mathias; Lemberger, Martin; Petersen, Silke; Amon, Brigitte; Erlbacher, Tobias; Bauer, Anton J.; Ryssel, Heiner; Paskaleva, Albena; Weinreich, Wenke; Fachmann, Christian; Heitmann, Johannes; Schroeder, Uwe

Detailed carrier lifetime analysis of iron-contaminated boron-doped silicon by comparison of simulation and measurement

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2008-01-01

PREAI

Rommel, M.; Bauer, A. J.; Ryssel, H.

Self-aligned growth of organometallic layers for nonvolatile memories: Comparison of liquid-phase and vapor-phase deposition

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2008-01-01

OAAI

Erlbacher, Tobias; Jank, Michael P. M.; Ryssel, Heiner; Frey, Lothar; Engl, Reimund; Walter, Andreas; Sezi, Recai; Dehm, Christine

MOCVD of tantalum nitride thin films from TBTEMT single source precursor as metal electrodes in CMOS applications

SURFACE & COATINGS TECHNOLOGY

IF6.1

2007-09-01

PREAI

Lemberger, M.; Thiemann, S.; Baunemann, A.; Parala, H.; Fischer, R. A.; Hinz, J.; Bauer, A. J.; Ryssel, H.

Characterization of the impurity profile at the SiO2/Si interface using a combination of total reflection X-ray fluorescence spectrometry and successive etching of silicon

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

IF3.8

2007-05-01

PREAI

Steen, C.; Nutsch, A.; Pichler, P.; Ryssel, H.

Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films

APPLIED SURFACE SCIENCE

IF6.9

2006-10-01

PREAI

Fried, M.; Petrik, P.; Horvath, Z. E.; Lohner, T.; Schmidt, C.; Schneider, C.; Ryssel, H.

Zirconium silicate films obtained from novel MOCVD precursors

JOURNAL OF NON-CRYSTALLINE SOLIDS

IF3.5

2003-07-01

PREAI

Lemberger, M; Paskaleva, A; Zürcher, S; Bauer, AJ; Frey, L; Ryssel, H

Characterisation of BaxSr1-xTiO3 films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction

JOURNAL OF NON-CRYSTALLINE SOLIDS

IF3.5

2002-05-01

PREAI

Petrik, P; Khánh, NQ; Horváth, ZE; Zolnai, Z; Bársony, I; Lohner, T; Fried, M; Gyulai, J; Schmidt, C; Schneider, C; Ryssel, H

Effect of barium contamination on gate oxide integrity in high-k dram

JOURNAL OF NON-CRYSTALLINE SOLIDS

IF3.5

2002-05-01

PREAI

Boubekeur, H; Mikolajick, T; Bauer, A; Frey, L; Ryssel, H

MOCVD of titanium dioxide on the basis of new precursors

JOURNAL OF NON-CRYSTALLINE SOLIDS

IF3.5

2002-05-01

PREAI

Leistner, T; Lehmbacher, K; Härter, P; Schmidt, C; Bauer, AJ; Frey, L; Ryssel, H

Non-destructive characterization of strontium bismuth tantalate films

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2002-04-01

PREAI

Petrik, P; Khánh, NQ; Horváth, ZE; Zolnai, Z; Bársony, I; Lohner, T; Fried, M; Gyulai, J; Schmidt, C; Schneider, C; Ryssel, H

Cell adhesion on modified polyethylene

JOURNAL OF MATERIALS SCIENCE

IF3.9

2002-01-01

PREAI

Svorcík, V; Rocková, K; Dvoránková, B; Broz, L; Hnatowicz, V; Ochsner, R; Ryssel, H

Indirect-coupling ultraviolet-sensitive photodetector with high electrical gain, fast response, and low noise

SENSORS AND ACTUATORS A-PHYSICAL

IF4.9

2000-10-01

PREAI

Qian, F; Schnupp, R; Chen, CQ; Helbig, R; Ryssel, H

研究方向