Yoram Vos - Publications, H-index & Citations

Yoram Vos

Delft University of Technology

5H指数

13论文数

362被引数

收录论文 3

发表时间

Electron-beam patterned calibration structures for structured illumination microscopy

SCIENTIFIC REPORTS

IF3.9

2022-11-23

OAAI

Hari, Sangeetha; Slotman, Johan A.; Vos, Yoram; Floris, Christian; van Cappellen, Wiggert A.; Hagen, C. W.; Stallinga, Sjoerd; Houtsmuller, Adriaan B.; Hoogenboom, Jacob P.

Structured illumination microscopy with noise-controlled image reconstructions

NATURE METHODS

IF32.1

2021-06-14

OAAI

Smith, Carlas S.; Slotman, Johan A.; Schermelleh, Lothar; Chakrova, Nadya; Hari, Sangeetha; Vos, Yoram; Hagen, Cornelis W.; Mueller, Marcel; van Cappellen, Wiggert; Houtsmuller, Adriaan B.; Hoogenboom, Jacob P.; Stallinga, Sjoerd

Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy

JOURNAL OF STRUCTURAL BIOLOGY-X

IF5.1

2021-01-01

OAAI

Lane, Ryan; Vos, Yoram; Wolters, Anouk H. G.; van Kessel, Luc; Chen, S. Elisa; Liv, Nalan; Klumperman, Judith; Giepmans, Ben N. G.; Hoogenboom, Jacob P.

研究方向