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T. Mitch Wallis

national institute of standards & technology (nist) - usa

11H指数
51论文数
329被引数
收录论文 7
发表时间
Microwaves and Microscopy
err2020-10-01
err0
errOAAI
errFarina, Marco; Wallis, T. Mitch
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Imaging Carrier Inhomogeneities in Ambipolar Tellurene Field Effect Transistors
err2019-01-23
err42
errOAAI
errBerweger, Samuel; Qiu, Gang; Wang, Yixiu; Pollard, Benjamin; Genter, Kristen L.; Tyrrell-Ead, Robert; Wallis, T. Mitch; Wu, Wenzhuo; Ye, Peide D.; Kabos, Pavel
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Robust Microwave Characterization of Inkjet-Printed Coplanar Waveguides on Flexible Substrates
err2017-12-01
err15
errOAAI
errSahu, Abhishek; Aaen, Peter H.; Lewandowski, Arkadiusz; Shkunov, Maxim; Rigas, Grigorios; Blanchard, Paul T.; Wallis, Thomas Mitch; Devabhaktuni, Vijay K.
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Measurement Techniques for RF Nanoelectronics
err2014-01-01
err3
PREAI
errWallis, T. Mitch; Pierantoni, Luca
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Micromachined resonators of high Q-factor based on atomic layer deposited alumina
err2009-09-01
err28
PREAI
errChang, Yuan-Jen; Gray, Jason M.; Imtiaz, Atif; Seghete, Dragos; Wallis, T. Mitch; George, Steven M.; Kabos, Pavel; Rogers, Charles T.; Bright, Victor M.
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Broadband electrical characterization of multiwalled carbon nanotubes and contacts
err2007-03-22
err56
PREAI
errRice, Paul; Wallis, T. Mitch; Russek, Stephen E.; Kabos, Pavel
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