Damir R. Islamov - Publications, H-index & Citations

Damir R. Islamov

russian academy of sciences

19H指数

105论文数

1.1K被引数

收录论文 18

发表时间

Atomic and Electronic Structure of Defect Ni Complexes and Oxygen Vacancies in HfO2 and Their Influence on Charge Transport in Memristors 缺陷Ni配合物和氧空位的原子与电子结构及其对忆阻器电荷输运的影响

Journal of Experimental and Theoretical Physics

IF0.8

2025-12-01

PREAI

Perevalov, T. V.; Islamov, D. R.; Chernov, A. A.

Electron and hole bipolar injection in magnesium oxide films

APPLIED PHYSICS LETTERS

IF3.6

2024-01-26

PREAI

Perevalov, Timofey V.; Islamov, Damir R.; Zalyalov, Timur M.; Gismatulin, Andrei A.; Golyashov, Vladimir A.; Tereshchenko, Oleg E.; Gorshkov, Dmitry V.; Gritsenko, Vladimir A.

Impact of lanthanum doping on the electronic structure of oxygen vacancies in hafnium oxide

COMPUTATIONAL MATERIALS SCIENCE

IF3.3

2024-01-01

PREAI

Perevalov, Timofey V.; Islamov, Damir R.

Exact statistical solution for the hopping transport of trapped charge via finite Markov jump processes

SCIENTIFIC REPORTS

IF3.9

2021-05-13

OAAI

Pil'nik, Andrey A.; Chernov, Andrey A.; Islamov, Damir R.

Oxygen vacancies in zirconium oxide as the blue luminescence centres and traps responsible for charge transport: Part II-Films

MATERIALIA

IF2.9

2021-03-01

PREAI

Islamov, Damir R.; Gritsenko, Vladimir A.; Perevalov, Timofey, V; Aliev, Vladimir Sh; Nadolinny, Vladimir A.; Chin, Albert

Oxygen vacancies in zirconium oxide as the blue luminescence centres and traps responsible for charge transport: Part I-Crystals

MATERIALIA

IF2.9

2021-03-01

PREAI

Islamov, Damir R.; Gritsenko, Vladimir A.; Perevalov, Timofey, V; Yelisseyev, Alexander P.; Pustovarov, Vladimir A.; Korolkov, Ilya, V; Lomonova, Elena E.

Impact of oxygen vacancy on the ferroelectric properties of lanthanum-doped hafnium oxide

APPLIED PHYSICS LETTERS

IF3.6

2020-10-19

PREAI

Islamov, Damir R.; Zalyalov, Timur M.; Orlov, Oleg M.; Gritsenko, Vladimir A.; Krasnikov, Gennady Ya.

Charge transport mechanism in dielectrics: drift and diffusion of trapped charge carriers

SCIENTIFIC REPORTS

IF3.9

2020-09-25

OAAI

Pil'nik, Andrey A.; Chernov, Andrey A.; Islamov, Damir R.

Identification of the nature of traps involved in the field cycling of Hf0.5Zr0.5O2-based ferroelectric thin films 鉴定基于Hf0.5Zr0.5O2的铁电薄膜的场循环中涉及的陷阱的性质

ACTA MATERIALIA

IF9.3

2019-03-01

OAAI

Islamov, Damir R.; Gritsenko, Vladimir A.; Perevalov, Timofey V.; Pustovarov, Vladimir A.; Orlov, Oleg M.; Chernikova, Anna G.; Markeev, Andrey M.; Slesazeck, Stefan; Schroeder, Uwe; Mikolajick, Thomas; Krasnikov, Gennadiy Ya

Oxygen Vacancy in Hafnia as a Blue Luminescence Center and a Trap of Charge Carriers

JOURNAL OF PHYSICAL CHEMISTRY C

IF3.2

2016-09-02

PREAI

Gritsenko, Vladimir A.; Islamov, Damir R.; Perevalov, Timofey V.; Aliev, Vladimir Sh.; Yelisseyev, Alexander P.; Lomonova, Elena E.; Pustovarov, Vladimir A.; Chin, Albert

The charge transport mechanism and electron trap nature in thermal oxide on silicon

APPLIED PHYSICS LETTERS

IF3.6

2016-08-01

OAAI

Islamov, Damir R.; Gritsenko, Vladimir A.; Perevalov, Timofey V.; Orlov, Oleg M.; Krasnikov, Gennady Ya.

Electronic properties of hafnium oxide: A contribution from defects and traps

PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS

IF29.5

2016-02-01

146

PREAI