未登录Macro and Micro-Scale Non-Contact Imaging of Electrically Active Extended Defects in 4H-SiC Merged PiN Schottky Diode Devices
Faisal, Firas; Steller, Nils; Karhu, Robin; Kallinger, Birgit; Polisski, Gennadi; Wilson, Marshall; Savtchouk, Alexandre; Gutierrez, Liliana; Almeida, Carlos; Soto, Cordero; Wilson, Bradley; Marinskiy, Dmitriy; Wincukiewicz, Adam; Lagowski, Jacek
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收藏Non-contact charge-voltage method for dielectric characterization on small test areas of IC product wafers
Edelman, Piotr; Marinskiy, Dmitriy; Almeida, Carlos; Kochey, Joseph N.; Byelyayev, Anton; Wilson, Marshall; Savtchouk, Alexandre; D'Amico, John; Findlay, Andrew; Jastrzebski, Lubek; Lagowski, Jacek
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