H. J. Kang - Publications, H-index & Citations

H. J. Kang

Chungbuk National University

14H指数

65论文数

591被引数

收录论文 10

发表时间

Feasibility of rapid piperine quantification in whole and black pepper using near infrared spectroscopy and chemometrics

JOURNAL OF FOOD SCIENCE

IF3.4

2020-09-05

PREAI

Park, Jong-Rak; Kang, Hyun-Hee; Cho, Jong-Ku; Moon, Kwang-Deog; Kim, Young-Jun

One electron-based smallest flexible logic cell

APPLIED PHYSICS LETTERS

IF3.6

2012-10-29

PREAI

Kim, S. J.; Lee, J. J.; Kang, H. J.; Choi, J. B.; Yu, Y. -S.; Takahashi, Y.; Hasko, D. G.

Band gap change and interfacial reaction in Hf-silicate film grown on Ge(001)

JOURNAL OF CHEMICAL PHYSICS

IF3.1

2008-10-29

PREAI

Cho, Y. -J.; Lee, W. J.; Kim, C. Y.; Cho, M. -H.; Kim, H.; Lee, H. J.; Moon, D. W.; Kang, H. J.

Effects of postnitridation annealing on band gap and band offsets of nitrided Hf-silicate films

APPLIED PHYSICS LETTERS

IF3.6

2008-01-17

OAAI

Chung, K. B.; Cho, M. -H.; Hwang, U.; Kang, H. J.; Suh, D. C.; Sohn, H. C.; Ko, D. -H.; Kim, S. H.; Jeon, H. T.

Band gap and band offsets for ultrathin (HfO2)x(SiO2)1-x dielectric films on Si(100)

APPLIED PHYSICS LETTERS

IF3.6

2006-09-19

PREAI

Jin, H.; Oh, S. K.; Kang, H. J.; Cho, M. -H.

Band alignment in ultrathin Hf-Al-O/Si interfaces

APPLIED PHYSICS LETTERS

IF3.6

2005-11-14

PREAI

Jin, H; Oh, SK; Kang, HJ; Lee, SW; Lee, YS; Cho, MH

Electron transfer through interfacial water layer studied by scanning tunneling microscopy (vol 108, pg 4367, 1998)

JOURNAL OF CHEMICAL PHYSICS

IF3.1

2003-11-08

OAAI

Hong, YA; Hahn, JR; Kang, H

Quantitative depth profiling of nitrogen in ultrathin oxynitride film with low energy SIMS

APPLIED SURFACE SCIENCE

IF6.9

2003-01-01

PREAI

Shon, HK; Kang, HJ; Hong, TE; Chang, HS; Kim, KJ; Kim, HK; Moon, DW

Multiple As delta layered Si thin films for SIMS quantification and depth scale calibration

APPLIED SURFACE SCIENCE

IF6.9

2003-01-01

PREAI

Cho, SB; Shon, HK; Kang, HJ; Hong, TE; Kim, HK; Lee, HI; Kim, KJ; Moon, DW

Damage profiling of Ar+ sputtered Si(100) surface by medium energy ion scattering spectroscopy

APPLIED SURFACE SCIENCE

IF6.9

1996-07-01

PREAI

Lee, JC; Jeong, CS; Kang, HJ; Kim, HK; Moon, DW

研究方向