R. B. Laibowitz - Publications, H-index & Citations

R. B. Laibowitz

ibm usa

45H指数

163论文数

7.9K被引数

收录论文 6

发表时间

Charge trapping at the low-k dielectric-silicon interface probed by the conductance and capacitance techniques

APPLIED PHYSICS LETTERS

IF3.6

2008-09-22

OAAI

Atkin, J. M.; Cartier, E.; Shaw, T. M.; Laibowitz, R. B.; Heinz, T. F.

Fabrication of patterned single-crystal SrTiO3 thin films by ion slicing and anodic bonding

APPLIED PHYSICS LETTERS

IF3.6

2006-09-19

PREAI

Lee, Yoo Seung; Djukic, Djordje; Roth, Ryan M.; Laibowitz, Robert; Izuhara, Tomoyuki; Osgood, Richard M., Jr.; Bakhru, Sasha; Bakhru, Hassaram; Si, Weidong; Welch, David

The effect of stress on the dielectric properties of barium strontium titanate thin films

APPLIED PHYSICS LETTERS

IF3.6

1999-10-04

328

PREAI

Shaw, TM; Suo, Z; Huang, M; Liniger, E; Laibowitz, RB; Baniecki, JD

Effects of annealing conditions on charge loss mechanisms in MOCVD Ba0.7Sr0.3TiO3 thin film capacitors

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY

IF6.2

1999-06-01

OAAI

Baniecki, JD; Laibowitz, RB; Shaw, TM; Saenger, KL; Duncombe, PR; Cabral, C; Kotecki, DE; Shen, H; Lian, J; Ma, QY

Compensation doping of Ba0.7Sr0.3TiO3 thin films

APPLIED PHYSICS LETTERS

IF3.6

1998-09-28

PREAI

Copel, M; Baniecki, JD; Duncombe, PR; Kotecki, D; Laibowitz, R; Neumayer, DA; Shaw, TM

Dielectric relaxation of Ba0.7Sr0.3TiO3 thin films from 1 mHz to 20 GHz

APPLIED PHYSICS LETTERS

IF3.6

1998-01-26

146

PREAI

Baniecki, JD; Laibowitz, RB; Shaw, TM; Duncombe, PR; Neumayer, DA; Kotecki, DE; Shen, H; Ma, QY

研究方向