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科言猫学术研究的AI总结
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Y

Yong Bum Seo

korea research institute of standards & science (kriss)

6H指数
11论文数
113被引数
收录论文 3
发表时间
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Single-shot spectrally resolved interferometry for the simultaneous measurement of the thickness and surface profile of multilayer films
errOPTICS EXPRESS
IF3.3
err2021-07-26
err5
errOAAI
errGhim, Young-Sik; Seo, Yong Bum; Joo, Ki-Nam; Rhee, Hyug-Gyo
err分享
err收藏
Single-shot freeform surface profiler
errOPTICS EXPRESS
IF3.3
err2020-01-24
err23
errOAAI
errSeo, Yong Bum; Jeong, Hyo Bin; Rhee, Hyug-Gyo; Ghim, Young-Sik; Joo, Ki-Nam
err分享
err收藏
Low cost wafer metrology using a NIR low coherence interferometry
errOPTICS EXPRESS
IF3.3
err2013-05-30
err18
errOAAI
errKim, Young Gwang; Seo, Yong Bum; Joo, Ki-Nam
err分享
err收藏

研究方向

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合作学者
合作期刊
H
Hyug-Gyo Rhee
H 指数: 19 · 论文数: 116
Y
Young-Sik Ghim
H 指数: 18 · 论文数: 93
K
Ki-Nam Joo
H 指数: 17 · 论文数: 93
H
Hyo Bin Jeong
H 指数: 3 · 论文数: 12
Y
Young Gwang Kim
H 指数: 1 · 论文数: 2
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