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W

W.T. Holman

vanderbilt university

28H指数
123论文数
2.6K被引数
收录论文 2
发表时间
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Trends in 45 nm Integrated Circuit Single-Event Upset Rates With Stacked-Transistor Layouts45纳米集成电路中采用堆叠晶体管布局的单粒子翻转率趋势
errIEEE Transactions on Nuclear Science
IF1.9
err2026-04-01
err0
PREAI
errHu, Michael D.; Trippe, James M.; Reed, Robert A.; Sierawski, Brian D.; Ball, Dennis R.; Kauppila, Jeffrey S.; Massengill, Lloyd W.; Holman, W. Timothy
err分享
err收藏
Design technique for mitigation of soft errors in differential switched-capacitor circuits
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
IF4.9
err2008-09-01
err26
PREAI
errFleming, Patrick R.; Olson, Brian D.; Holman, W. Timothy; Bhuva, Bharat L.; Massengill, Lloyd W.
err分享
err收藏

研究方向

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合作学者
合作期刊
L
L. W. Massengill
H 指数: 59 · 论文数: 370
B
B. L. Bhuva
H 指数: 47 · 论文数: 361
B
Brian D. Olson
H 指数: 10 · 论文数: 19
M
Massengill, Lloyd W.
H 指数: 0 · 论文数: 4
T
Trippe, James M.
H 指数: 0 · 论文数: 7
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