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收藏Evidence of 2D intersubband scattering in thin film fully depleted silicon-on-insulator transistors operating at 4.2K
Casse, Mikael; Paz, Brune Cardoso; Ghibaudo, Gerard; Poiroux, Thierry; Vincent, Emmanuel; Galy, Philippe; Juge, Andre; Gaillard, Fred; de Franceschi, Silvano; Meunier, Tristan; Vinet, Maud
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