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Philippe Galy

stmicroelectronics

14H指数
176论文数
990被引数
收录论文 4
发表时间
3D simulation of charge defect impact on an industrial 28 nm FD-SOI quantum dot3D模拟电荷缺陷对工业级28 nm FD-SOI量子点的影响
err2025-11-01
err0
PREAI
errBureau, Benjamin; Beaudoin, Felix; Philippopoulos, Pericles; Mir, Salvador; Dupont-Ferrier, Eva; Galy, Philippe
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Robust technology computer-aided design of gated quantum dots at cryogenic temperature
err2022-06-27
err8
PREAI
errBeaudoin, Felix; Philippopoulos, Pericles; Zhou, Chenyi; Kriekouki, Ioanna; Pioro-Ladriere, Michel; Guo, Hong; Galy, Philippe
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Evidence of 2D intersubband scattering in thin film fully depleted silicon-on-insulator transistors operating at 4.2K
err2020-06-15
err14
PREAI
errCasse, Mikael; Paz, Brune Cardoso; Ghibaudo, Gerard; Poiroux, Thierry; Vincent, Emmanuel; Galy, Philippe; Juge, Andre; Gaillard, Fred; de Franceschi, Silvano; Meunier, Tristan; Vinet, Maud
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On the Low-Frequency Noise Characterization of Z2-FET Devices
err2019-01-01
err4
errOAAI
errMarquez, Carlos; Navarro, Carlos; Navarro, Santiago; Padilla, Jose L.; Donetti, Luca; Sampedro, Carlos; Galy, Philippe; Kim, Yong-Tae; Gamiz, Francisco
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