Si-An Wen - Publications & Citations | 科言猫

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Si-An Wen

national cheng kung university

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Quantitative scanning capacitance microscopy enabled by machine learning and electrostatic modeling 机器学习与静电建模赋能的定量扫描电容显微镜

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

IF1.2

2026-03-01

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Ho, Sheng-Zhu; Wen, Si-An; Chen, Yi-Chun; Gui, Dong; Hu, Wei-Shan

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