logo
科言猫学术研究的AI总结
language
手机端手机端
  • Phone Feature微信小程序
简体中文简体中文
notice消息通知
博客博客
delete
arrow
返回
K

Kin P. Cheung

national institute of standards & technology

28H指数
272论文数
3.4K被引数
收录论文 19
发表时间
logo
Fast I–V Characterization System with Expanded Application Range Featuring 25 V Sub-10 ns Gate Drive and 10 ns Current Measurement Capability具有25 V亚10 ns门极驱动和10 ns电流测量能力的快速I–V特性测试系统
errIEEE Transactions on Instrumentation and Measurement
IF5.9
err2026-09-22
err0
PREAI
errYu-Xin Wen; Bing-Yue Tsui; Kin P. Cheung
err分享
err收藏
A field-effect transistor-based room-temperature quantum current source
errAPPLIED PHYSICS LETTERS
IF3.6
err2023-05-04
err1
PREAI
errCheung, Kin P.; O'Sullivan, Barry J.
err分享
err收藏
Nanoscale MOSFET as a Potential Room-Temperature Quantum Current Source纳米MOSFET作为潜在的室温量子电流源
errMICROMACHINES
IF3
err2020-03-31
err7
errOAAI
errCheung, Kin P.; Wang, Chen; Campbell, Jason P.
err分享
err收藏
Ultrafast measurements of polarization switching dynamics on ferroelectric and anti-ferroelectric hafnium zirconium oxide
errAPPLIED PHYSICS LETTERS
IF3.6
err2019-08-14
err100
errOAAI
errSi, Mengwei; Lyu, Xiao; Shrestha, Pragya R.; Sun, Xing; Wang, Haiyan; Cheung, Kin P.; Ye, Peide D.
err分享
err收藏
Nonresonant Transmission Line Probe for Sensitive Interferometric Electron Spin Resonance Detection
errANALYTICAL CHEMISTRY
IF6.7
err2019-08-05
err6
errOAAI
errShrestha, Pragya R.; Abhyankar, Nandita; Anders, Mark A.; Cheung, Kin P.; Gougelet, Robert; Ryan, Jason T.; Szalai, Veronika; Campbell, Jason P.
err分享
err收藏
Ferroelectricity in Polar Polymer-Based FETs: A Hysteresis Analysis
errADVANCED FUNCTIONAL MATERIALS
IF19
err2018-01-15
err16
errOAAI
errGeorgiou, Vasileia; Veksler, Dmitry; Campbell, Jason P.; Shrestha, Pragya R.; Ryan, Jason T.; Ioannou, Dimitris E.; Cheung, Kin P.
err分享
err收藏
Highly Efficient Rapid Annealing of Thin Polar Polymer Film Ferroelectric Devices at Sub-Glass Transition Temperature
errADVANCED FUNCTIONAL MATERIALS
IF19
err2017-12-18
err2
PREAI
errGeorgiou, Vasileia; Veksler, Dmitry; Ryan, Jason T.; Campbell, Jason P.; Shrestha, Pragya R.; Ioannou, Dimitris E.; Cheung, Kin P.
err分享
err收藏
Quantifying Short-Lived Events in Multistate Ionic Channel Measurements (vol 8, pg 1547, 2014)
errACS NANO
IF16
err2015-11-16
err3
errOAAI
errBalijepalli, Arvind; Ettedgui, Jessica; Comb, Andrew T.; Robertson, Joseph W. F.; Cheung, Kin P.; Kasianowicz, John J.; Vaz, Canute
err分享
err收藏
Electron Spin Resonance Scanning Probe Spectroscopy for Ultrasensitive Biochemical Studies
errANALYTICAL CHEMISTRY
IF6.7
err2015-04-22
err22
PREAI
errCampbell, Jason P.; Ryan, Jason T.; Shrestha, Pragya R.; Liu, Zhanglong; Vaz, Canute; Kim, Ji-Hong; Georgiou, Vasileia; Cheung, Kin P.
err分享
err收藏
Interface-state capture cross section-Why does it vary so much?
errAPPLIED PHYSICS LETTERS
IF3.6
err2015-04-21
err20
PREAI
errRyan, J. T.; Matsuda, A.; Campbell, J. P.; Cheung, K. P.
err分享
err收藏
Quantifying Short-Lived Events in Multistate Ionic Current Measurements
errACS NANO
IF16
err2014-01-14
err88
errOAAI
errBalijepalli, Arvind; Ettedgui, Jessica; Cornio, Andrew T.; Robertson, Joseph W. F.; Cheung, Kin P.; Kasianowicz, John J.; Vaz, Canute
err分享
err收藏
Quantifying Short-Lived Events in Multi-State Ionic Channel Measurements
errBIOPHYSICAL JOURNAL
IF3.1
err2014-01-01
err0
PREAI
errBalijepalli, Arvind; Vaz, Canute; Ettedgui, Jessica; Cornio, Andrew T.; Robertson, Joseph W. F.; Cheung, Kin P.; Pastor, Richard W.; Kasianowicz, John J.
err分享
err收藏
On the U-shaped continuum of band edge states at the Si/SiO2 interface
errAPPLIED PHYSICS LETTERS
IF3.6
err2011-12-01
err15
PREAI
errRyan, J. T.; Southwick, R. G.; Campbell, J. P.; Cheung, K. P.; Young, C. D.; Suehle, J. S.
err分享
err收藏
Spectroscopic charge pumping investigation of the amphoteric nature of Si/SiO2 interface states
errAPPLIED PHYSICS LETTERS
IF3.6
err2011-06-06
err20
PREAI
errRyan, J. T.; Yu, L. C.; Han, J. H.; Kopanski, J. J.; Cheung, K. P.; Zhang, F.; Wang, C.; Campbell, J. P.; Suehle, J. S.
err分享
err收藏
Negative-bias temperature instability induced electron trapping
errAPPLIED PHYSICS LETTERS
IF3.6
err2008-07-23
err5
PREAI
errCampbell, J. P.; Cheung, K. P.; Suehle, J. S.; Oates, A.
err分享
err收藏
Carrier capture at the SiO2-Si interface:: A physical model
errAPPLIED PHYSICS LETTERS
IF3.6
err2007-09-12
err18
PREAI
errWang, Y.; Cheung, K. P.
err分享
err收藏
Substrate effect on the thickness of spin-coated ultrathin polymer film
errAPPLIED PHYSICS LETTERS
IF3.6
err2005-11-15
err17
PREAI
errCheung, KP; Grover, R; Wang, Y; Gurkovich, C; Wang, G; Scheinbeim, J
err分享
err收藏
Electron trap distribution in thin oxide after high-field stress
errAPPLIED PHYSICS LETTERS
IF3.6
err2005-03-02
err6
PREAI
errCheung, KP; Hits, D; Wang, Y
err分享
err收藏
Temperature effect on ultrathin SiO2 time-dependent-dielectric-breakdown
errAPPLIED PHYSICS LETTERS
IF3.6
err2003-09-22
err13
errOAAI
errCheung, KP
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
王海燕 封面图
王海燕 (Haiyan Wang)
H 指数: 102 · 论文数: 1.7K
R
Richard W. Pastor
H 指数: 73 · 论文数: 282
P
Peide D. Ye
H 指数: 59 · 论文数: 439
J
John J. Kasianowicz
H 指数: 46 · 论文数: 155
J
John S. Suehle
H 指数: 43 · 论文数: 266
查看更多