Nadine Collaert - Publications, H-index & Citations

Nadine Collaert

imec, leuven, belgium

46H指数

796论文数

1.1W被引数

收录论文 39

发表时间

AlN/Si interface engineering to mitigate RF losses in MOCVD-grown GaN-on-Si substrates

APPLIED PHYSICS LETTERS

IF3.6

2024-08-15

OAAI

Cardinael, Pieter; Yadav, Sachin; Hahn, Herwig; Zhao, Ming; Banerjee, Sourish; Esfeh, Babak Kazemi; Mauder, Christof; O'Sullivan, Barry; Peralagu, Uthayasankaran; Vohra, Anurag; Langer, Robert; Collaert, Nadine; Parvais, Bertrand; Raskin, Jean-Pierre

Charge Trapping and Emission during Bias Temperature Stressing of Schottky Gate GaN-on-Silicon HEMT Structures Targeting RF/mm Wave Power Amplifiers 针对RF/mm波功率放大器的肖特基栅极GaN-on-Silicon HEMT结构的偏置温度应力期间的电荷俘获和发射

MICROMACHINES

IF3

2024-07-24

OAAI

O'Sullivan, Barry; Rathi, Aarti; Alian, Alireza; Yadav, Sachin; Yu, Hao; Sibaja-Hernandez, Arturo; Peralagu, Uthayasankaran; Parvais, Bertrand; Chasin, Adrian; Collaert, Nadine

Thermal budget increased alloy disorder scattering of 2DEG in III-N heterostructures

APPLIED PHYSICS LETTERS

IF3.6

2022-05-26

PREAI

Yu, Hao; Parvais, Bertrand; Zhao, Ming; Rodriguez, Raul; Peralagu, Uthayasankaran; Alian, Alireza; Collaert, Nadine

Monolithic Integration of Nano-Ridge Engineered InGaP/GaAs HBTs on 300 mm Si Substrate

MATERIALS

IF3.2

2021-09-29

OAAI

Mols, Yves; Vais, Abhitosh; Yadav, Sachin; Witters, Liesbeth; Vondkar, Komal; Alcotte, Reynald; Baryshnikova, Marina; Boccardi, Guillaume; Waldron, Niamh; Parvais, Bertrand; Collaert, Nadine; Langer, Robert; Kunert, Bernardette

Application of an Sb Surfactant in InGaAs Nano-ridge Engineering on 300 mm Silicon Substrates

CRYSTAL GROWTH & DESIGN

IF3.4

2021-02-08

PREAI

Kunert, Bernardette; Alcotte, Reynald; Mols, Yves; Baryshnikova, Marina; Waldron, Niamh; Collaert, Nadine; Langer, Robert

Deep-Level Transient Spectroscopy of GaAs Nanoridge Diodes Grown on Si Substrates

PHYSICAL REVIEW APPLIED

IF4.4

2020-08-31

PREAI

Syshchyk, O.; Hsu, B.; Yu, H.; Motsnyi, V.; Vais, A.; Kunert, B.; Mols, Y.; Alcotte, R.; Puybaret, R.; Waldron, N.; Soussan, P.; Boulenc, P.; Karve, G.; Simoen, E.; Collaert, N.; Puers, B.; Van Hoof, C.

The impact of extended defects on the generation and recombination lifetime in n type In.53Ga.47As

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2019-09-12

PREAI

Hsu, Po-Chun (Brent); Simoen, Eddy; Merckling, Clement; Eneman, Geert; Mols, Yves; Han, Han; Alian, AliReza; Collaert, Nadine; Heyns, Marc

A flexible InGaAs nanomembrane PhotoFET with tunable responsivities in near- and short-wave IR region for lightweight imaging applications

APL MATERIALS

IF4.5

2019-02-06

OAAI

Li, Yida; Alian, Alireza; Sivan, Maheswari; Huang, Li; Ang, Kah Wee; Lin, Dennis; Mocuta, Dan; Collaert, Nadine; Thean, Aaron V. -Y.

Non-destructive characterization of extended crystalline defects in confined semiconductor device structures

NANOSCALE

IF5.1

2018-01-01

OAAI

Schulze, Andreas; Strakos, Libor; Vystavel, Tomas; Loo, Roger; Pacco, Antoine; Collaert, Nadine; Vandervorst, Wilfried; Caymax, Matty

Correlation between surface reconstruction and polytypism in InAs nanowire selective area epitaxy

PHYSICAL REVIEW MATERIALS

IF3.4

2017-12-26

PREAI

Liu, Ziyang; Merckling, Clement; Rooyackers, Rita; Richard, Olivier; Bender, Hugo; Mols, Yves; Vila, Maria; Rubio-Zuazo, Juan; Castro, German R.; Collaert, Nadine; Thean, Aaron; Vandervorst, Wilfried; Heyns, Marc

Advances on Doping Strategies for Triple-Gate FinFETs and Lateral Gate-All-Around Nanowire FETs and Their Impact on Device Performance (vol 62, pg 2, 2017)

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2017-06-01

PREAI

Veloso, A.; De Keersgieter, A.; Matagne, P.; Horiguchi, N.; Collaert, N.

Advances on doping strategies for triple-gate finFETs and lateral gate-all-around nanowire FETs and their impact on device performance 三栅finfet和横向栅全包围纳米线fet掺杂策略及其对器件性能影响的研究进展

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2017-05-01

PREAI

Veloso, A.; De Keersgieter, A.; Matagne, P.; Horiguchi, N.; Collaert, N.

InGaAs tunnel FET with sub-nanometer EOT and sub-60 mV/dec sub-threshold swing at room temperature

APPLIED PHYSICS LETTERS

IF3.6

2016-12-14

OAAI

Alian, A.; Mols, Y.; Bordallo, C. C. M.; Verreck, D.; Verhulst, A.; Vandooren, A.; Rooyackers, R.; Agopian, P. G. D.; Martino, J. A.; Thean, A.; Lin, D.; Mocuta, D.; Collaert, N.

Systematic study of interfacial reactions induced by metal electrodes in high-k/InGaAs gate stacks

APPLIED PHYSICS LETTERS

IF3.6

2016-10-24

PREAI

Yoshida, S.; Lin, D.; Vais, A.; Alian, A.; Franco, J.; El Kazzi, S.; Mols, Y.; Miyanami, Y.; Nakazawa, M.; Collaert, N.; Watanabe, H.; Thean, A.

Contact resistivities of metal-insulator-semiconductor contacts and metal-semiconductor contacts

APPLIED PHYSICS LETTERS

IF3.6

2016-04-25

PREAI

Yu, Hao; Schaekers, Marc; Barla, Kathy; Horiguchi, Naoto; Collaert, Nadine; Thean, Aaron Voon-Yew; De Meyer, Kristin

Strained c:Si0.55Ge0.45 with embedded e:Si0.75Ge0.25 S/D IFQW SiGe-pFET for DRAM periphery applications

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2016-02-01

PREAI

Ritzenthaler, R.; Schram, T.; Witters, L.; Mitard, J.; Spessot, A.; Caillat, C.; Hellings, G.; Eneman, G.; Aoulaiche, M.; Na, H. -J.; Son, Y.; Noh, K. B.; Fazan, P.; Lee, S. -G.; Collaert, N.; Mocuta, A.; Horiguchi, N.; Thean, A. V. -Y.

Impact of starting measurement voltage relative to flat-band voltage position on the capacitance-voltage hysteresis and on the defect characterization of InGaAs/high-k metal-oxide-semiconductor stacks

APPLIED PHYSICS LETTERS

IF3.6

2015-12-03

PREAI

Vais, Abhitosh; Franco, Jacopo; Lin, Han-Chung; Collaert, Nadine; Mocuta, Anda; De Meyer, Kristin; Thean, Aaron

Extracting the effective bandgap of heterojunctions using Esaki diode I-V measurements

APPLIED PHYSICS LETTERS

IF3.6

2015-08-17

OAAI

Smets, Quentin; Verhulst, Anne S.; El Kazzi, Salim; Verreck, Devin; Richard, Olivier; Bender, Hugo; Collaert, Nadine; Mocuta, Anda; Thean, Aaron; Heyns, Marc M.

Temperature dependence of frequency dispersion in III-V metal-oxide-semiconductor C-V and the capture/emission process of border traps

APPLIED PHYSICS LETTERS

IF3.6

2015-08-06

PREAI

Vais, Abhitosh; Lin, Han-Chung; Dou, Chunmeng; Martens, Koen; Ivanov, Tsvetan; Xie, Qi; Tang, Fu; Givens, Michael; Maes, Jan; Collaert, Nadine; Raskin, Jean-Pierre; DeMeyer, Kristin; Thean, Aaron

Quantitative Method to Determine Planar Defect Frequency in In As Nanowires by High Resolution X-ray Diffraction

CRYSTAL GROWTH & DESIGN

IF3.4

2015-07-07

PREAI

Liu, Ziyang; Merckling, Clement; Caymax, Matty; Rooyackers, Rita; Collaert, Nadine; Thean, Aaron; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried; Heyns, Marc

研究方向