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Paolo Bernardi

Polytechnic University of Turin

23H指数
194论文数
2.2K被引数
收录论文 17
发表时间
A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories嵌入式SoC存储器中全面数据收集与保留的通用策略
err2026-01-01
err0
PREAI
errBernardi, Paolo; Insinga, Gioroio; Battilana, Matteo; Beer, Peter; Carnevale, Giambattista; Coppetta, Matteo; Mautone, Nellina; Repele, Alberto; Scaramuzza, Pierre; Ullmann, Rudolf
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Netlist-Independent Functional Stress Pattern Generation Strategy for AI HW Accelerators Embedded into SoCs嵌入soc的AI硬件加速器的网表独立功能应力模式生成策略
err2025-11-03
err0
errOAAI
errGabriele Filipponi; Denis Schwachhofer; Francesco Angione; Claudia Bertani; Simone Corbellini; Nicola di Gruttola Giardino; Giuseppe Garozzo; Giorgio Insinga; Vincenzo Tancorre; Paolo Bernardi
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A System-Level Test Methodology for Communication Peripherals in System-on-Chips片上系统中通信外围设备的系统级测试方法
err2025-02-01
err0
errOAAI
errAngione, Francesco; Bernardi, Paolo; Giardino, Nicola di Gruttola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo
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A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs
err2024-01-01
err0
errOAAI
errIaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Cardone, Lorenzo; Garozzo, Giuseppe; Tancorre, Vincenzo
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A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress
err2023-05-01
err3
errOAAI
errAngione, Francesco; Appello, Davide; Bernardi, Paolo; Bertani, Claudia; Gallo, Giovambattista; Littardi, Stefano; Pollaccia, Giorgio; Ruggeri, Walter; Reorda, Matteo Sonza; Tancorre, Vincenzo; Ugioli, Roberto
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A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips
err2023-01-01
err2
errOAAI
errAngione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; Reorda, Matteo Sonza; Tancorre, Vincenzo; Ugioli, Roberto
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Parallel Multithread Analysis of Extremely Large Simulation Traces
err2022-01-01
err2
errOAAI
errAppello, D.; Bernardi, Paolo; Calabrese, Andrea; Pollaccia, G.; Quer, Stefano; Tancorre, V; Ugioli, R.
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Software-Based Self-Test Techniques for Dual-Issue Embedded Processors基于软件的双问题嵌入式处理器自测试技术
err2020-04-01
err4
PREAI
errBernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; Sanchez, Ernesto; Sansonetti, Alessandro; Squillero, Giovanni
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Scan-Chain Intra-Cell Aware Testing
err2018-04-01
err4
PREAI
errTouati, Aymen; Bosio, Alberto; Girard, Patrick; Virazel, Arnaud; Bernardi, Paolo; Reorda, Matteo Sonza; Auvray, Etienne
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Development Flow for On-Line Core Self-Test of Automotive Microcontrollers
err2016-03-01
err66
errOAAI
errBernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; Sanchez, Ernesto; Sansonetti, Alessandro
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MIHST: A Hardware Technique for Embedded Microprocessor Functional On-Line Self-Test
err2014-11-01
err12
PREAI
errBernardi, Paolo; Ciganda, Lyl Mercedes; Sanchez, Ernesto; Reorda, Matteo Sonza
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A new hybrid fault detection technique for systems-on-a-chip
err2006-02-01
err49
PREAI
errBernardi, P; Bolzani, LMV; Rebaudengo, M; Reorda, MS; Vargas, FL; Violante, M
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