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Peter J. Klar

justus liebig university gießen

46H指数
404论文数
9.3K被引数
收录论文 129
发表时间
Characterization of the performance of a RIT-10 and rf-neutralizer for an ABEP systemRIT-10和rf-neutralizer在ABEP系统中的性能表征
err2025-11-12
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errOAAI
errZorn, Jana; Braumer, Kalle J.; Rodriguez, Rodrigo S.; Wolki, Andreas R.; Keil, Konstantin; Komjagin, Anna; Bremer, Fiene B.; Hellbert, Aaron; Reuss-Hennschen, Mathis; Kaufmann, Arnold; Krempel-Hesse, Johannes; Chen, Limei; Holste, Kristof; Klar, Peter J.
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Assessing AlN||VO2||AlN Multilayer Architectures Deposited by Ion-Beam Sputtering for Smart Window Applications
err2024-08-09
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PREAI
errBecker, Martin; Wollenweber-Bienerth, Yan Ravil; Hauptmann, Jonas; Celik, Erdem; Polity, Angelika; Chatterjee, Sangam; Klar, Peter J.
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Hybrid Piezoresistive 2D MoS2/PEGDA/PANI Covalent Hydrogels for the Sensing of Low-to-Medium Pressure
err2024-06-13
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errOAAI
errDomenici, Sara; Micheli, Sara; Crisci, Matteo; Rohnke, Marcus; Hergert, Hannes; Allione, Marco; Wang, Mengjiao; Smarlsy, Bernd; Klar, Peter J.; Lamberti, Francesco; Cimetta, Elisa; Ceseracciu, Luca; Gatti, Teresa
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Decoupling inert and reactive gas supply to optimize ion beam sputter deposition apparatus for a more efficient material deposition
err2024-06-01
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errOAAI
errBenz, Sebastian L.; Mueller, Isabel; Polity, Angelika; Klar, Peter J.; Becker, Martin; Chatterjee, Sangam
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Influence of Microstructure on the Material Properties of LLZO Ceramics Derived by Impedance Spectroscopy and Brick Layer Model Analysis
err2023-09-26
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PREAI
errEckhardt, Janis K.; Kremer, Sascha; Fuchs, Till; Minnmann, Philip; Schubert, Johannes; Burkhardt, Simon; Elm, Matthias T.; Klar, Peter J.; Heiliger, Christian; Janek, Juergen
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Overcoming the Miscibility Gap of GaN/InN in MBE Growth of Cubic In x Ga1-x N克服x Ga1-x N立方的MBE生长中GaN/InN的混溶间隙
err2023-08-02
err5
PREAI
errZscherp, Mario Fabian; Jentsch, Silas Aurel; Mueller, Marius Johannes; Lider, Vitalii; Becker, Celina; Chen, Limei; Littmann, Mario; Meier, Falco; Beyer, Andreas; Hofmann, Detlev Michael; As, Donat Josef; Klar, Peter Jens; Volz, Kerstin; Chatterjee, Sangam; Schoermann, Joerg
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Correlation of metal-to-insulator transition and strain state of VO2 thin films on TiO2 (110) substrates
err2023-07-24
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PREAI
errLu, Hao; Li, Lei; Tang, Zhiwu; Xu, Maji; Zheng, Yonghui; Becker, Martin; Lu, Yinmei; Li, Mingkai; Li, Pai; Zhang, Zaoli; Klar, Peter J. J.; He, Yunbin
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Employing Ion-Beam Sputter Deposited TiO2 Buffer Layers for VO2-Related Devices
err2023-06-19
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PREAI
errBecker, Martin; Kuhl, Florian; Hauptmann, Jonas; Kessler, Jill; Benz, Sebastian L. L.; Chatterjee, Sangam; Polity, Angelika; Klar, Peter J. J.
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Distance and size dependence of the interactions within highly ordered magnetic nanoparticle mesocrystals
err2023-05-05
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PREAI
errNeugebauer, Nils; Wang, Yi; Elm, Matthias T.; Hofmann, Detlev M.; Heiliger, Christian; Ye, Xingchen; Klar, Peter J.
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On the Highly Ordered Graphene Structure of Non-Graphitic Carbons (NGCs)-A Wide-Angle Neutron Scattering (WANS) Study
err2023-02-27
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errOAAI
errOsswald, Oliver; Loeh, Marc O.; Badaczewski, Felix M.; Pfaff, Torben; Fischer, Henry E.; Franz, Alexandra; Hoffmann, Jens-Uwe; Reehuis, Manfred; Klar, Peter J.; Smarsly, Bernd M.
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Identifying different electronic transport mechanisms in nanoporous inorganic electrides - a combined study using Hall measurements and electron paramagnetic resonance spectroscopy
err2023-01-01
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PREAI
errDinter, Julius K.; Lange, Jurek; Hofmann, Detlev M.; Fernandez, J. Fabian Plaza; Post, Angel; Chatterjee, Sangam; Elm, Matthias T.; Klar, Peter J.
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