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Hyeon-Jun Lee

dgist

31H指数
10论文数
3.5K被引数
收录论文 10
发表时间
Interface roughness effects and relaxation dynamics of an amorphous semiconductor oxide-based analog resistance switching memory
err2023-01-01
err9
errOAAI
errHaripriya, G. R.; Noh, Hee Yeon; Lee, Chan-Kang; Kim, June-Seo; Lee, Myoung-Jae; Lee, Hyeon-Jun
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Hydrogen diffusion and its electrical properties variation as a function of the IGZO stacking structure
err2022-11-17
err18
errOAAI
errNoh, Hee Yeon; Lee, Woo-Geun; Haripriya, G. R.; Cha, Jung-Hwa; Kim, June-Seo; Yun, Won Seok; Lee, Myoung-Jae; Lee, Hyeon-Jun
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Parasitic Current Induced by Gate Overlap in Thin-Film Transistors
err2021-04-29
err0
errOAAI
errLee, Hyeon-Jun; Abe, Katsumi; Kim, June-Seo; Yun, Won Seok; Lee, Myoung-Jae
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Measurement of Exciton and Trion Energies in Multistacked hBN/WS2 Coupled Quantum Wells for Resonant Tunneling Diodes
err2020-11-03
err17
errOAAI
errLee, Myoung-Jae; Seo, David H.; Kwon, Sung Min; Kim, Dohun; Kim, Youngwook; Yun, Won Seok; Cha, Jung-Hwa; Song, Hyeon-Kyo; Lee, Shinbuhm; Jung, MinKyung; Lee, Hyeon-Jun; Kim, June-Seo; Heo, Jae-Sang; Seo, Sunae; Park, Sung Kyu
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Analysis of the hump phenomenon and needle defect states formed by driving stress in the oxide semiconductor
err2019-08-19
err20
errOAAI
errLee, Hyeon-Jun; Abe, Katsumi; Noh, Hee Yeon; Kim, June-Seo; Lee, Hyunki; Lee, Myoung-Jae
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Impact of transient currents caused by alternating drain stress in oxide semiconductors
err2017-08-29
err19
errOAAI
errLee, Hyeon-Jun; Cho, Sung Haeng; Abe, Katsumi; Lee, Myoung-Jae; Jung, Minkyung
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