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Sergiu Clima

IMEC

40H指数
185论文数
5.2K被引数
收录论文 27
发表时间
Chalcogenide Selector-Only Memory硫属元素化物仅选择器存储器
err2026-06-16
err0
PREAI
errJiayi Zhao; Yuting Sun; Kun Ren; Taras Ravsher; Daniele Garbin; Sergiu Clima; Min Zhu
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Non-Arrhenius threshold switching by field-driven dipolar ordering场驱偶极有序的非阿伦尼乌斯阈值开关
err2026-05-13
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errOAAI
errWen-Xiong Song; Guangjie Shi; Qi Hu; Fan Zhu; Tianjiao Xin; Ying Chen; Sergiu Clima; Gilberto Teobaldi; Yuhao Wang; Wenjian Huang; Sannian Song; Cheol Seong Hwang; Li-Min Liu; Yan Cheng; Zhitang Song
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Chalcogenide Ovonic Threshold Switching Selector硫族化合物双向阈值开关选择器
err2024-01-11
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errOAAI
errZhao, Zihao; Clima, Sergiu; Garbin, Daniele; Degraeve, Robin; Pourtois, Geoffrey; Song, Zhitang; Zhu, Min
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In silico screening for As/Se-free ovonic threshold switching materials
err2023-06-03
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errOAAI
errClima, Sergiu; Matsubayashi, Daisuke; Ravsher, Taras; Garbin, Daniele; Delhougne, Romain; Kar, Gouri Sankar; Pourtois, Geoffrey
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Strain and ferroelectricity in wurtzite ScxAl1-xN materials
err2021-10-28
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PREAI
errClima, Sergiu; Pashartis, Christopher; Bizindavyi, Jasper; McMitchell, Sean R. C.; Houssa, Michel; Van Houdt, Jan; Pourtois, Geoffrey
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Elucidating possible crystallographic origins of wake-up mechanisms in ferroelectric hafnia
err2021-03-02
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errOAAI
errMcMitchell, Sean R. C.; Clima, Sergiu; Ronchi, Nicolo'; Banerjee, Kaustuv; Celano, Umberto; Popovici, Mihaela; Di Piazza, Luca; Van den Bosch, Geert; Van Houdt, Jan
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Impact of changes in bond structure on ovonic threshold switching behaviour in GeSe2 (vol 35, pg 151, 2020)
err2021-01-01
err0
errOAAI
errKeukelier, Jonas; Opsomer, Karl; Nuytten, Thomas; Sergeant, Stefanie; Devulder, Wouter; Clima, Sergiu; Goux, Ludovic; Kar, Gouri Sankar; Detavernier, Christophe
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Impact of changes in bond structure on ovonic threshold switching behaviour in GeSe2
err2021-01-01
err12
errOAAI
errKeukelier, Jonas; Opsomer, Karl; Nuytten, Thomas; Sergeant, Stefanie; Devulder, Wouter; Clima, Sergiu; Goux, Ludovic; Kar, Gouri Sankar; Detavernier, Christophe
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Identifying alternative ferroelectric materials beyond Hf(Zr)O2
err2020-12-28
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errOAAI
errGuo, Jing; Clima, Sergiu; Pourtois, Geoffrey; Van Houdt, Jan
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Defect profiling in FEFET Si:HfO2 layers
err2020-11-17
err30
errOAAI
errO'Sullivan, B. J.; Putcha, V; Izmailov, R.; Afanas'ev, V; Simoen, E.; Jung, T.; Higashi, Y.; Degraeve, R.; Truijen, B.; Kaczer, B.; Ronchi, N.; McMitchell, S.; Banerjee, K.; Clima, S.; Breuil, L.; Van den Bosch, G.; Linten, D.; Van Houdt, J.
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Microcanonical RT-TDDFT simulations of realistically extended devices
err2018-09-24
err4
PREAI
errAndermatt, Samuel; Bani-Hashemian, Mohammad Hossein; Ducry, Fabian; Bruck, Sascha; Clima, Sergiu; Pourtois, Geoffrey; VandeVondele, Joost; Luisier, Mathieu
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Voltage-controlled reverse filament growth boosts resistive switching memory电压控制的反向灯丝生长提高了电阻开关存储器
err2018-02-02
err24
PREAI
errBelmonte, Attilio; Celano, Umberto; Chen, Zhe; Radhaskrishnan, Janaki; Redolfi, Augusto; Clima, Sergiu; Richard, Olivier; Bender, Hugo; Kar, Gouri Sankar; Vandervorst, Wilfried; Goux, Ludovic
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Direct Probing of the Dielectric Scavenging-Layer Interface in Oxide Filamentary-Based Valence Change Memory
err2017-03-16
err51
PREAI
errCelano, Umberto; de Beeck, Jonathan Op; Clima, Sergiu; Luebben, Michael; Koenraad, Paul M.; Goux, Ludovic; Valov, Ilia; Vandervorst, Wilfried
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Ab initio modeling of oxygen-vacancy formation in doped-HfOx RRAM: Effects of oxide phases, stoichiometry, and dopant concentrations
err2015-07-06
err55
PREAI
errZhao, Liang; Clima, Sergiu; Magyari-Kope, Blanka; Jurczak, Malgorzata; Nishi, Yoshio
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Endurance degradation mechanisms in TiN\Ta2O5\Ta resistive random-access memory cells
err2015-02-02
err43
PREAI
errChen, C. Y.; Goux, L.; Fantini, A.; Clima, S.; Degraeve, R.; Redolfi, A.; Chen, Y. Y.; Groeseneken, G.; Jurczak, M.
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Identification of the ferroelectric switching process and dopant-dependent switching properties in orthorhombic HfO2: A first principles insight
err2014-03-05
err210
PREAI
errClima, S.; Wouters, D. J.; Adelmann, C.; Schenk, T.; Schroeder, U.; Jurczak, M.; Pourtois, G.
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Low leakage Ru-strontium titanate-Ru metal-insulator-metal capacitors for sub-20 nm technology node in dynamic random access memory
err2014-02-26
err34
PREAI
errPopovici, M.; Swerts, J.; Redolfi, A.; Kaczer, B.; Aoulaiche, M.; Radu, I.; Clima, S.; Everaert, J. -L.; Van Elshocht, S.; Jurczak, M.
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First-principles simulation of oxygen diffusion in HfOx: Role in the resistive switching mechanism
err2012-03-26
err92
PREAI
errClima, S.; Chen, Y. Y.; Degraeve, R.; Mees, M.; Sankaran, K.; Govoreanu, B.; Jurczak, M.; De Gendt, S.; Pourtois, G.
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