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收藏Application of SCF-LTDP technology for a-Si:H film defective passivation in X-ray PIN-based photosensor
Chen, Jian-Jie; Chen, Min-Chen; Chang, Ting-Chang; Chen, Hong-Chih; Zhou, Kuan-Ju; Kuo, Chuan-Wei; Yang, Chih-Cheng; Wu, Pei-Yu; Shih, Chih-Cheng; Huang, Jen-Wei 分享 收藏 Abnormal hump in low temperature in SiGe devices with silicon capping insertion layerHuang, Wei-Chen; Chen, Po-Hsun; Lin, Chih-Yang; Zheng, Hao-Xuan; Chen, Hong-Chih; Ciou, Fong-Min; Tan, Yung-Fang; Chang, Kai-Chun; Lin, Yun-Hsuan; Chang, Yen-Cheng; Lin, Shih-Kai; Hung, Wei-Chun; Thio, Wesley; Chang, Ting-Chang 分享 收藏 Abnormal threshold voltage shift caused by trapped holes under hot-carrier stress in a-IGZO TFTsShao, Jingjing; Su, Wan-Ching; Chang, Ting-Chang; Chen, Hong-Chih; Zhou, Kuan-Ju; Lu, I-Nien; Tu, Yu-Fa; Shih, Yu-Shan; Tsai, Tsung-Ming; Lien, Chen-Hsin; Yang, Jianwen; Zhang, Qun 分享 收藏 Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist EnvironmentChen, Hong-Chih; Kuo, Chuan-Wei; Chang, Ting-Chang; Lai, Wei-Chih; Chen, Po-Hsun; Chen, Guan-Fu; Huang, Shin-Ping; Chen, Jian-Jie; Zhou, Kuan-Ju; Shih, Chih-Cheng; Tsao, Yu-Ching; Huang, Hui-Chun; Sze, Simon M. 分享 收藏 Cyclical Annealing Technique To Enhance Reliability of Amorphous Metal Oxide Thin Film Transistors提高非晶金属氧化物薄膜晶体管可靠性的循环退火技术Chen, Hong-Chih; Chang, Ting-Chang; Lai, Wei-Chih; Chen, Guan-Fu; Chen, Bo-Wei; Hung, Yu-Ju; Chang, Kuo-Jui; Cheng, Kai-Chung; Huang, Chen-Shuo; Chen, Kuo-Kuang; Lu, Hsueh-Hsing; Lin, Yu-Hsin 分享 收藏 分享 收藏 
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