logo
科言猫学术研究的AI总结
language
手机端手机端
  • Phone Feature微信小程序
简体中文简体中文
notice消息通知
博客博客
delete
arrow
返回
Y

Yaqing Chi

national university of defense technology

12H指数
113论文数
642被引数
收录论文 18
发表时间
logo
A Current-Steering DAC With a Complementary Structured Charge-Pump-Based Voltage-Limited Driver for Code-Dependent Error Suppression一种带互补结构电荷泵型电压限幅驱动器的电流舵数模转换器，用于抑制码相关误差
errIEEE Transactions on Very Large Scale Integration (VLSI) Systems
IF3.1
err2026-04-29
err0
PREAI
errTianyu Yu; Biwen Shi; Wei Zhang; Deng Luo; Xin Zhang; Ming Tao; Jianjun Chen; Yaqing Chi; Guofang Yu; Dongxun Li; Bin Liang
err分享
err收藏
Quantitative investigation of well contact impact on single-event transient in sub-20 nm FinFET process亚20 nm FinFET工艺中井接触对单事件瞬态影响的定量研究
errNuclear Science and Techniques
IF3.8
err2026-01-21
err0
PREAI
errQian Sun; Bin Liang; Ya-Qing Chi; Ming Tao; Zhen-Yu Wu; Hong-Xia Guo; Wang-Yong Chen; Jian-Jun Chen; Peng-Cheng Huang; Deng Luo; Han-Han Sun; Ya-Hao Fang; Yu-Lin Gao; Ming-Yan Ma; Yang Guo
err分享
err收藏
Influence of Substrate Bias on Total Ionizing Dose Degradation of 16-nm n-FinFETs基底偏置对16-nm n-FinFETs总电离剂量退化的影响
errIEEE TRANSACTIONS ON NUCLEAR SCIENCE
IF1.9
err2025-12-01
err0
PREAI
errChang, Yuhai; Zheng, Qiwen; Cui, Jiangwei; Chi, Yaqing; Liang, Bin; Guo, Yang; Guo, Qi; Li, Yudong
err分享
err收藏
An Area-Efficient Fractional Output Divider Based on Foreground DTC INL Calibration一种基于前景DTC INL校准的面积高效分数输出分频器
errieee transactions on circuits and systems ii: express briefs
IF0
err2025-11-19
err0
PREAI
errYan Yu; Deng Luo; Ming Tao; Jianjun Chen; Yaqing Chi; Guofang Yu; Jingtian Liu; Bin Liang
err分享
err收藏
Analysis of Single-Event Effects in Clock and Data Recovery Circuits Based on an LC Voltage-Controlled Oscillator
errIEEE TRANSACTIONS ON NUCLEAR SCIENCE
IF1.9
err2025-11-01
err0
PREAI
errFang, Yahao; Chen, Jianjun; Liang, Bin; Chi, Yaqing; Luo, Deng; Sun, Hanhan; Sun, Qian; Yu, Bo; Guo, Yang
err分享
err收藏
Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 nm CMOS Technology亚20 nm CMOS工艺中低压差稳压器的单粒子瞬态特性表征
errIEEE TRANSACTIONS ON NUCLEAR SCIENCE
IF1.9
err2025-10-01
err0
PREAI
errWang, Xun; Chen, Jianjun; Liang, Bin; Wen, Yi; Shen, Fan; Chi, Yaqing; Luo, Deng; Yu, Guofang
err分享
err收藏
A Compact Low-Jitter All-Digital Fractional Output Divider Using Split-DTC-Based Background Calibration一种采用基于分裂DTC的背景校准的低抖动全数字分数输出分频器
errIEEE Journal of Solid-State Circuits
IF5.6
err2025-08-29
err0
PREAI
errDeng Luo; Yan Yu; Jianjun Chen; Yang Guo; Yaqing Chi; Guofang Yu; Hao Ding; Jing Xiao; Hao Gao; Ming Tao; Kai Tang; Bin Liang
err分享
err收藏
Gate breakdown induced stuck bits in sub-20 nm FinFET SRAM
errAPPLIED PHYSICS LETTERS
IF3.6
err2024-07-08
err0
PREAI
errSun, Qian; Chi, Yaqing; Guo, Yang; Liang, Bin; Tao, Ming; Wu, Zhenyu; Guo, Hongxia; Zheng, Qiwen; Chen, Wangyong; Gao, Yulin; Zhao, Peixiong; Li, Xingji; Chen, Jianjun; Luo, Deng; Sun, Hanhan; Fang, Yahao
err分享
err收藏
Heavy ion-induced microdose effects on the reliability of planar and FinFET-based SRAM physical unclonable functions
errAPPLIED PHYSICS LETTERS
IF3.6
err2024-06-27
err0
PREAI
errShao, Jinjin; Song, Ruiqiang; Li, Shaoqing; Guo, Yang; Chi, Yaqing; Liang, Bin; Chen, Jianjun; Wang, Yaohua
err分享
err收藏
Adsorption mechanism of SO2 on vacancy-defected graphene and Ti doped graphene: A DFT study
errSUPERLATTICES AND MICROSTRUCTURES
IF3.3
err2021-11-01
err10
PREAI
errZhang, Zhendong; Liang, Bin; Chi, Yaqing; Jiang, Yande; Song, Juan; Guo, Yang
err分享
err收藏
28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery
errIEEE ACCESS
IF3.6
err2019-01-01
err8
errOAAI
errYuan, Hengzhou; Guo, Yang; Chen, Jianjun; Chi, Yaqing; Chen, Xi; Liang, Bin
err分享
err收藏
Influence of Oxygen Vacancy Density on the Polaronic Configuration in Rutile
errMATERIALS
IF3.2
err2018-11-01
err7
errOAAI
errLiu, Rulin; Fang, Liang; Hao, Yue; Chi, Yaqing
err分享
err收藏
Comparison of single-event upset generated by heavy ion and pulsed laser
errSCIENCE CHINA-INFORMATION SCIENCES
IF7.6
err2017-06-13
err10
PREAI
errLiang, Bin; Song, Ruiqiang; Han, Jianwei; Chi, Yaqing; Chen, Rui; Hu, Chunmei; Chen, Jianjun; Ma, Yingqi; Shangguan, Shipeng
err分享
err收藏
Experimental characterization of the dominant multiple nodes charge collection mechanism in metal oxide-semiconductor transistors
errAPPLIED PHYSICS LETTERS
IF3.6
err2017-06-09
err8
PREAI
errSong, Ruiqiang; Chen, Shuming; Chi, Yaqing; Wu, Zhenyu; Liang, Bin; Chen, Jianjun; Xu, Jingyan; Hao, Peipei; Yu, Junting
err分享
err收藏
Modeling the impact of process and operation variations on the soft error rate of digital circuits
errSCIENCE CHINA-INFORMATION SCIENCES
IF7.6
err2017-02-24
err3
PREAI
errSong, Ruiqiang; Chen, Shuming; Liang, Bin; Chi, Yaqing; Chen, Jianjun
err分享
err收藏
Experimental characterization of the bipolar effect on P-hit single-event transients in 65 nm twin-well and triple-well CMOS technologies
errSCIENCE CHINA-TECHNOLOGICAL SCIENCES
IF4.9
err2016-03-03
err5
PREAI
errChen JianJun; Liang Bin; Chi YaQing
err分享
err收藏
Modeling to predict the time evolution of negative bias temperature instability (NBTI) induced single event transient pulse broadening
errSCIENCE CHINA-TECHNOLOGICAL SCIENCES
IF4.9
err2012-02-24
err4
PREAI
errChen ShuMing; Chen JianJun; Chi YaQing; Liu FanYu; He YiBai
err分享
err收藏
Interaction of Total Ionizing Dose Effect and Hot Carrier Degradation in Bulk I/O-FinFETs总剂量效应与热载流子退化的相互作用在体I/O-FinFETs中
errIEEE Transactions on Electron Devices
IF3.2
err
err0
PREAI
errJiangwei Cui; Qiwen Zheng; Yaqing Chi; Bin Liang; Xiaolong Li; Yang Guo; Qi Guo; Yudong Li
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
Y
Yue Hao
H 指数: 67 · 论文数: 1.3K
B
Bin Liang
H 指数: 48 · 论文数: 420
宋
宋娟 (Juan Song)
H 指数: 36 · 论文数: 162
李
李绍清 (Shaoqing Li)
H 指数: 34 · 论文数: 260
X
Xingji Li
H 指数: 28 · 论文数: 301
查看更多