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J

J. F. Zhang

Southeast University

35H指数
236论文数
3.7K被引数
收录论文 16
发表时间
Magnetic Properties and Kondo Effect in Ce3TiBi5 under High Pressure
err2026-01-01
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PREAI
errL.C. Fu; W.J. Cheng; L.C. Shi; B.S. Min; Y. Peng; J. Zhang; J. Song; Z. Deng; J.F. Zhao; Y. Liu; J.L. Zhu; J.F. Zhang; X.C. Wang; C.Q. Jin
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Active Thermal Management for β-Ga2O3 Schottky Barrier Diodes Based on Thermoelectric Coolers基于热电制冷器的β-Ga₂O₃肖特基势垒二极管主动热管理
err2025-07-01
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PREAI
errLongbing Yi; Xuefeng Zheng; Fang Zhang; Shaozhong Yue; Shunyu Wang; Wen Hong; Weidong Zhang; Jianfu Zhang; Xiaohua Ma; Yue Hao
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A Pragmatic Model to Predict Future Device Aging
err2023-01-01
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errOAAI
errBrown, James; Tok, Kean Hong; Gao, Rui; Ji, Zhigang; Zhang, Weidong; Marsland, John S.; Chiarella, Thomas; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri; Zhang, Jian Fu
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Synaptic 1/f noise injection for overfitting suppression in hardware neural networks
err2022-08-05
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errOAAI
errDu, Yan; Shao, Wei; Chai, Zheng; Zhao, Hanzhang; Diao, Qihui; Gao, Yawei; Yuan, Xihui; Wang, Qiaoqiao; Li, Tao; Zhang, Weidong; Zhang, Jian Fu; Min, Tai
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On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude
err2021-01-01
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errOAAI
errMehedi, Mehzabeen; Tok, Kean Hong; Ye, Zengliang; Zhang, Jian Fu; Ji, Zhigang; Zhang, Weidong; Marsland, John S.
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Random-telegraph-noise-enabled true random number generator for hardware security
err2020-10-14
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errOAAI
errBrown, James; Zhang, Jian Fu; Zhou, Bo; Mehedi, Mehzabeen; Freitas, Pedro; Marsland, John; Ji, Zhigang
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An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants评估随机电报噪声时间常数的统计分布
err2020-01-01
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errOAAI
errMehedi, Mehzabeen; Tok, Kean Hong; Zhang, Jian Fu; Ji, Zhigang; Ye, Zengliang; Zhang, Weidong; Marsland, John S.
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An assessment of the mobility degradation induced by remote charge scattering
err2009-12-29
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PREAI
errJi, Z.; Zhang, J. F.; Zhang, W.; Groeseneken, G.; Pantisano, L.; De Gendt, S.; Heyns, M. M.
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Impact of different defects on the kinetics of negative bias temperature instability of hafnium stacks
err2008-01-02
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PREAI
errZhang, J. F.; Zhao, C. Z.; Chang, M. H.; Zahid, M. B.; Peaker, A. R.; Hall, S.; Groeseneken, G.; Pantisano, L.; De Gendt, S.; Heyns, M.
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Threshold voltage instability of p-channel metal-oxide-semiconductor field effect transistors with hafnium based dielectrics
err2007-04-02
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PREAI
errZhao, C. Z.; Zahid, M. B.; Zhang, J. F.; Groeseneken, G.; Degraeve, R.; De Gendt, S.
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Impact of gate materials on positive charge formation in HfO2/SiO2 stacks
err2006-07-12
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PREAI
errZhao, C. Z.; Zhang, J. F.; Zahid, M. B.; Groeseneken, G.; Degraeve, R.; De Gendt, S.
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On the interface states generated under different stress conditions
err2001-11-05
err23
PREAI
errZhang, WD; Zhang, JF; Uren, MJ; Groeseneken, G; Degraeve, R; Lalor, M; Burton, D
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THE COMPUTATION OF SELF-SIMILAR ARCS
err1987-11-01
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PREAI
errZHANG, JF; NEWLAND, DB; FANG, MTC
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