Preface: Special issue on control of semiconductor interfaces and group-IV semiconductor engineering technologies (ISCSI-X & ICSI/ISTDM 2025)半导体界面控制与IV族半导体工程技术特刊前言(ISCSI-X & ICSI/ISTDM 2025)Materials Science in Semiconductor ProcessingIF4.62026-03-210PRE
Improved carrier mobility of Sn-doped Ge thin films (≤20 nm) on insulator by interface-modulated solid-phase crystallization combined with surface passivationMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSINGIF4.62023-10-013PRE
Modulation of Schottky barrier at metal/Ge contacts by phosphoric acid coating and excimer laser annealingMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSINGIF4.62023-06-011PRE
Preface: Special issue on control of semiconductor interfaces (ISCSI-IX)MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSINGIF4.62023-05-010PRE
Layer-exchange crystallization for low-temperature (∼450°C) formation of n-type tensile-strained Ge on insulatorAPPLIED PHYSICS LETTERSIF3.62020-10-266OAAI
Enhanced mobility of Sn-doped Ge thin-films (≤50nm) on insulator for fully depleted transistors by nucleation-controlled solid-phase crystallizationAPPLIED PHYSICS LETTERSIF3.62019-07-2317OAAI
RETRACTION: Nucleation-controlled low-temperature solid-phase crystallization for Sn-doped polycrystalline-Ge film on insulator with high carrier mobility (∼550 cm2/V s) (Retraction of Vol 112, art no 242103, 2018)APPLIED PHYSICS LETTERSIF3.62018-07-110OAAI
RETRACTED: Nucleation-controlled low-temperature solid-phase crystallization for Sn-doped polycrystalline-Ge film on insulator with high carrier mobility (∼550 cm2/V s) (Retracted Article)APPLIED PHYSICS LETTERSIF3.62018-06-117PREAI
Large single-crystal Ge-on-insulator by thermally-assisted(∼400 °C) Si seeded-pulse-laser annealingMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSINGIF4.62017-11-012PREAI
High carrier mobility of Sn-doped polycrystalline-Ge films on insulators by thickness-dependent low-temperature solid-phase crystallizationAPPLIED PHYSICS LETTERSIF3.62016-12-0648PREAI
Pulse number controlled laser annealing for GeSn on insulator structure with high substitutional Sn concentrationAPPLIED PHYSICS LETTERSIF3.62016-07-0122PREAI
Low-temperature (∼180 ° C) position-controlled lateral solid-phase crystallization of GeSn with laser-anneal seedingAPPLIED PHYSICS LETTERSIF3.62015-12-2918PREAI
Ultra-high-speed lateral solid phase crystallization of GeSn on insulator combined with Sn-melting-induced seedingAPPLIED PHYSICS LETTERSIF3.62014-11-2033PREAI
Large-grain SiGe-on-insulator with uniform Si concentration by segregation-free rapid-melting growthAPPLIED PHYSICS LETTERSIF3.62014-09-1010PREAI
High carrier mobility in orientation-controlled large-grain (≥50 μm) Ge directly formed on flexible plastic by nucleation-controlled gold-induced-crystallizationAPPLIED PHYSICS LETTERSIF3.62014-06-2668PREAI
The Effects of Annealing Temperatures on Composition and Strain in SixGe1-x Obtained by Melting Growth of Electrodeposited Ge on Si (100)MATERIALSIF3.22014-02-246OAAI
Crystallization of Electrodeposited Germanium Thin Film on Silicon (100)MATERIALSIF3.22013-11-0613OAAI
Nucleation-controlled gold-induced-crystallization for selective formation of Ge(100) and (111) on insulator at low-temperature (∼250 °C)APPLIED PHYSICS LETTERSIF3.62013-08-1966PREAI
High-quality formation of multiply stacked SiGe-on-insulator structures by temperature-modulated successive rapid-melting-growthAPPLIED PHYSICS LETTERSIF3.62013-03-0420PREAI
Growth-rate-dependent laterally graded SiGe profiles on insulator by cooling-rate controlled rapid-melting-growthAPPLIED PHYSICS LETTERSIF3.62012-12-1029OAAI