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Dominique Planson

universite grenoble alpes (uga)

18H指数
343论文数
1.8K被引数
收录论文 12
发表时间
New insights in vertical GaN-on-GaN Schottky diode by Raman, cathodoluminescence and electrical characterizations通过拉曼光谱、阴极发光和电学特性表征获得的垂直GaN-on-GaN肖特基二极管的新见解
err2025-06-05
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errOAAI
errVishwajeet Maurya; Daniel Alquier; Maroun Dagher; Camille Sonneville; Dominique Planson; Hala El Rammouz; Thomas Kaltsounis; Eric Frayssinet; Yvon Cordier; Nevine Rochat; Matthew Charles; Julien Buckley
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A Novel Isolation Approach for GaN-Based Power Integrated Devices
err2024-09-30
err0
errOAAI
errZaidan, Zahraa; Al Taradeh, Nedal; Benjelloun, Mohammed; Rodriguez, Christophe; Soltani, Ali; Tasselli, Josiane; Isoird, Karine; Phung, Luong Viet; Sonneville, Camille; Planson, Dominique; Cordier, Yvon; Morancho, Frederic; Maher, Hassan
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Advanced characterization of SiC devices by optical beam induced current (OBIC): Experimental and simulation results
err2024-08-01
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PREAI
errPlanson, Dominique; Tournier, Dominique; Sonneville, Camille; Bevilacqua, Pascal; Phung, Luong Viet; Morel, Herve
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Experimental and simulation results of optical beam induced current technique applied to wide bandgap semiconductors
err2019-05-01
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errOAAI
errPlanson, Dominique; Asllani, Besar; Luong-Viet Phung; Bevilacqua, Pascal; Hamad, Hassan; Raynaud, Christophe
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Optical beam induced current measurements based on two-photon absorption process in 4H-SiC bipolar diodes
err2014-02-24
err12
errOAAI
errHamad, H.; Raynaud, C.; Bevilacqua, P.; Tournier, D.; Vergne, B.; Planson, D.
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Very low specific contact resistance measurements made on a highly p-type doped 4H-SiC layer selectively grown by vapor-liquid-solid transport
err2013-05-31
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errOAAI
errThierry-Jebali, N.; Vo-Ha, A.; Carole, D.; Lazar, M.; Ferro, G.; Planson, D.; Henry, A.; Brosselard, P.
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State of the art of high temperature power electronics
err2011-03-01
err320
errOAAI
errButtay, Cyril; Planson, Dominique; Allard, Bruno; Bergogne, Dominique; Bevilacqua, Pascal; Joubert, Charles; Lazar, Mihai; Martin, Christian; Morel, Herve; Tournier, Dominique; Raynaud, Christophe
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Extreme dielectric strength in boron doped homoepitaxial diamond
err2010-11-29
err145
errOAAI
errVolpe, Pierre-Nicolas; Muret, Pierre; Pernot, Julien; Omnes, Franck; Teraji, Tokuyuki; Koide, Yasuo; Jomard, Francois; Planson, Dominique; Brosselard, Pierre; Dheilly, Nicolas; Vergne, Bertrand; Scharnholz, Sigo
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Ni-Al ohmic contact to p-type 4H-SiC
err2006-10-01
err33
errOAAI
errVang, H.; Lazar, M.; Brosselard, P.; Raynaud, C.; Cremillieu, P.; Leclercq, J. -L.; Bluet, J. -M.; Scharnholz, S.; Planson, D.
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A 4H-SiC high-power-density VJFET as controlled current limiter
err2003-09-01
err14
errOAAI
errTournier, D; Godignon, P; Montserrat, J; Planson, D; Raynaud, C; Chante, JP; de Palma, JF; Sarrus, F
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Experimental characterization of a 4H-SiC high voltage current limiting device
err2001-12-01
err1
PREAI
errNallet, F; Planson, D; Godignon, P; Locatelli, ML; Lazar, M; Chante, JP
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Angle etch control for silicon carbide power devices
err1996-07-08
err37
PREAI
errLanois, F; Lassagne, P; Planson, D; Locatelli, ML
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