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Piotr Edelman

机构信息待补充

13H指数
69论文数
648被引数
收录论文 4
发表时间
Kelvin Force Microscopy and corona charging for semiconductor material and device characterization
err2016-11-01
err0
PREAI
errMarinskiy, Dmitriy; Edelman, Piotr; Lagowski, Jacek; Loy, Thye Chong; Almeida, Carlos; Savtchouk, Alexandre
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Drift characteristics of mobile ions in SiNx films and solar cells
err2015-11-01
err41
PREAI
errWilson, Marshall; Savtchouk, Alexandre; Edelman, Piotr; Marinskiy, Dmitriy; Lagowski, Jacek
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Improved QSS-μPCD measurement with quality of decay control: Correlation with steady-state carrier lifetime
err2012-11-01
err14
PREAI
errWilson, Marshall; Edelman, Piotr; Lagowski, Jacek; Olibet, Sara; Mihailetchi, Valentin
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Non-contact charge-voltage method for dielectric characterization on small test areas of IC product wafers
err2006-02-01
err8
PREAI
errEdelman, Piotr; Marinskiy, Dmitriy; Almeida, Carlos; Kochey, Joseph N.; Byelyayev, Anton; Wilson, Marshall; Savtchouk, Alexandre; D'Amico, John; Findlay, Andrew; Jastrzebski, Lubek; Lagowski, Jacek
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