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U

Umberto Celano

arizona state university-tempe

29H指数
152论文数
3.4K被引数
收录论文 47
发表时间
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Who needs an electrical back-contact after all?毕竟谁需要电气背接触？
errNanoscale
IF5.1
err2026-05-06
err0
PREAI
errMd Ashiqur Rahman Laskar; Md Jayed Hossain; Srijan Chakrabarti; Sanchari Sen; Renee Sailus; Youssry Botros; Milan Pesic; Rob Davenport; Ondřej Novotný; Jelínek Eduard; Albert Davydov; Ivan Sanchez Esqueda; Seth Ariel Tongay; Umberto Celano
err分享
err收藏
Reactive Pulsed Laser Deposition of Epitaxial Bi2O2Se for Field-Effect Transistor Application反应性脉冲激光沉积法制备用于场效应晶体管应用的二维Bi2O2Se外延薄膜
errAdvanced Functional Materials
IF19
err2026-05-02
err0
PREAI
errCheng-Lun Wu; Jing Xie; Jayed Hossain; Ângela Agra; Girish J. Patil; Ashiqur Rahman Laskar; Ayesha B. Rahman; Milan Pesic; Youssry Y. Botros; Umberto Celano; Ivan Sanchez Esqueda; Seth Ariel Tongay
err分享
err收藏
On the contrast mechanism of scanning microwave impedance microscopy on buried and doped features关于扫描微波阻抗显微镜对埋层和掺杂特征的对比机制
errJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
IF1.2
err2026-05-01
err0
PREAI
errMagnarin, Lorenzo Andrea; Caligaris, Filippo Ozino; Moran-Meza, Jose; Aghassi-Hagmann, Jasmin; Celano, Umberto
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err收藏
Electrical Conductivity of Copper-Graphene (Cu-Gr) Composites: The Underlying Mechanisms of Ultrahigh Conductivity铜-石墨烯（Cu-Gr）复合材料的电导率：超高通电导率的潜在机制
errSmall
IF12.1
err2026-04-01
err0
PREAI
errYao, Jiali; Das, Uschuas Dipta; Safari, Hamid; Laskar, Md Ashiqur Rahman; Yeom, Junghoon; Celano, Umberto; Kang, Wonmo
err分享
err收藏
Electron-Beam Excited Conductive Atomic Force Microscopy for Back Contact Free, Wafer-Scale and In-Line Compatible Electrical Characterization of 2D Materials (Adv. Sci. 44/2025)电子束激发导电原子力显微镜在无背接触、晶圆级和在生产线兼容的二维材料电学表征中的应用 (Adv. Sci. 44/2025)
errAdvanced Science
IF14.1
err2025-11-27
err0
errOAAI
errMd Ashiqur Rahman Laskar; Sakib Ahmed; Pinakapani Tummala; Alessandro Molle; Alessio Lamperti; Renee Sailus; Youssry Y Botros; Milan Pesic; Rob Davenport; Ondřej Novotný; Jan Neuman; Fabrizio Toia; Ivan Sanchez Esqueda; Seth Ariel Tongay; Umberto Celano
err分享
err收藏
Selected Papers from the 50th International Symposium for Testing and Failure Analysis (ISTFA 2024)《第50届国际测试与失效分析研讨会（ISTFA 2024）精选论文集》
errJOURNAL OF FAILURE ANALYSIS AND PREVENTION
IF1.2
err2025-10-01
err0
errOAAI
errCelano, Umberto; Altmann, Frank
err分享
err收藏
Electron-Beam Excited Conductive Atomic Force Microscopy for Back Contact Free, Wafer-Scale and In-Line Compatible Electrical Characterization of 2D Materials电子束激发导电原子力显微镜用于无背接触、晶圆级和在线兼容的二维材料电学表征
errAdvanced Science
IF14.1
err2025-08-27
err0
errOAAI
errMd Ashiqur Rahman Laskar; Sakib Ahmed; Pinakapani Tummala; Alessandro Molle; Alessio Lamperti; Renee Sailus; Youssry Y Botros; Milan Pesic; Rob Davenport; Ondřej Novotný; Jan Neuman; Fabrizio Toia; Ivan Sanchez Esqueda; Seth Ariel Tongay; Umberto Celano
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err收藏
In-Situ Workflow for Electrical Characterization of Semiconducting Structures using AFM-in-SEM Technology
errMicroscopy and Microanalysis
IF3
err2025-07-25
err0
errOAAI
errOndřej Novotný; Veronika Hegrová; Rosalinda Ring; Umberto Celano; Jan Neuman
err分享
err收藏
Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurations
errMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
IF4.6
err2025-03-01
err0
PREAI
errLaskar, Md Ashiqur Rahman; Chakrabarti, Srijan; Ahmed, Sakib; Ghoreishi, S. Amir; Tummala, Pinakapani; Afanas'ev, Valeri; Molle, Alessandro; Lamperti, Alessio; Celano, Umberto
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Controllable synthesis of environmentally stable vdW antiferromagnetic oxyhalide CrOCl环境稳定的vdW反铁磁氧卤化物CrOCl的可控合成
errNANOSCALE
IF5.1
err2025-01-01
err0
PREAI
errBanerjee, Rounak; Uppala, Sai; Kopaczek, Jan; Ahmed, Sakib; Wu, Cheng-Lun; Kumar, Mukesh; Yumigeta, Kentaro; Celano, Umberto; Tongay, Seth Ariel
err分享
err收藏
Adaptive Scalpel Scanning Probe Microscopy for Enhanced Volumetric Sensing in Tomographic Analysis自适应手术刀扫描探针显微镜可在层析分析中增强体积传感
errADVANCED MATERIALS INTERFACES
IF4.4
err2024-06-24
err1
errOAAI
errLaskar, Md Ashiqur Rahman; Leonetti, Giuseppe; Milano, Gianluca; Novotny, Ondrej; Neuman, Jan; Tongay, Sefaattin; Celano, Umberto
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Nano-positive up negative down in binary oxide ferroelectrics
errAPL MATERIALS
IF4.5
err2024-02-14
err1
errOAAI
errGomez, Andres; Celano, Umberto
err分享
err收藏
Quantum Conductance in Vertical Hexagonal Boron Nitride Memristors with Graphene-Edge Contacts具有石墨烯边缘接触的垂直六方氮化硼忆阻器中的量子电导
errNANO LETTERS
IF9.1
err2024-01-22
err8
PREAI
errXie, Jing; Patoary, Md Naim; Rahman Laskar, Md Ashiqur; Ignacio, Nicholas D.; Zhan, Xun; Celano, Umberto; Akinwande, Deji; Esqueda, Ivan Sanchez
err分享
err收藏
Probing geometry-induced magnetic defects in cylindrical modulated nanowires with optically detected spin resonance in nitrogen-vacancy center in diamond
errNANOSCALE
IF5.1
err2024-01-01
err0
PREAI
errCelano, Umberto; Rickhaus, Peter; Bran, Cristina; Marques-Marchan, Jorge; Borras, Vicent J.; Korytov, Maxim; Asenjo, Agustina; Vazquez, Manuel
err分享
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Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
errNANOMATERIALS
IF4.3
err2023-07-19
err0
errOAAI
errChang, Ting-Yu; Wang, Kuan-Chi; Liu, Hsien-Yang; Hseun, Jing-Hua; Peng, Wei-Cheng; Ronchi, Nicolo; Celano, Umberto; Banerjee, Kaustuv; Van Houdt, Jan; Wu, Tian-Li
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Advanced characterization methods for HfO2/ZrO2-based ferroelectricsHfO2/ZrO2-based铁电体的先进表征方法
errFRONTIERS IN NANOTECHNOLOGY
IF3.8
err2023-01-24
err2
errOAAI
errLomenzo, Patrick D. D.; Celano, Umberto; Kaempfe, Thomas; McMitchell, Sean R. C.
err分享
err收藏
Quantum Conductance in Memristive Devices: Fundamentals, Developments, and Applications忆阻器件中的量子电导: 基本原理、发展和应用
errADVANCED MATERIALS
IF26.8
err2022-07-01
err52
errOAAI
errMilano, Gianluca; Aono, Masakazu; Boarino, Luca; Celano, Umberto; Hasegawa, Tsuyoshi; Kozicki, Michael; Majumdar, Sayani; Menghini, Mariela; Miranda, Enrique; Ricciardi, Carlo; Tappertzhofen, Stefan; Terabe, Kazuya; Valov, Ilia
err分享
err收藏
Probing Magnetic Defects in Ultra-Scaled Nanowires with Optically Detected Spin Resonance in Nitrogen-Vacancy Center in Diamond
errNANO LETTERS
IF9.1
err2021-12-09
err7
errOAAI
errCelano, Umberto; Zhong, Hai; Ciubotaru, Florin; Stoleriu, Laurentiu; Stark, Alexander; Rickhaus, Peter; de Oliveira, Felipe Favaro; Munsch, Mathieu; Favia, Paola; Korytov, Maxim; Van Marcke, Patricia; Maletinsky, Patrick; Adelmann, Christoph; van der Heide, Paul
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err收藏
Electrical tuning of phase-change antennas and metasurfaces相变天线和元表面的电气调谐
errNATURE NANOTECHNOLOGY
IF34.9
err2021-04-19
err240
PREAI
errWang, Yifei; Landreman, Patrick; Schoen, David; Okabe, Kye; Marshall, Ann; Celano, Umberto; Wong, H. -S. Philip; Park, Junghyun; Brongersma, Mark L.
err分享
err收藏
Elucidating possible crystallographic origins of wake-up mechanisms in ferroelectric hafnia
errAPPLIED PHYSICS LETTERS
IF3.6
err2021-03-02
err16
errOAAI
errMcMitchell, Sean R. C.; Clima, Sergiu; Ronchi, Nicolo'; Banerjee, Kaustuv; Celano, Umberto; Popovici, Mihaela; Di Piazza, Luca; Van den Bosch, Geert; Van Houdt, Jan
err分享
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研究方向

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合作学者
合作期刊
M
Mark L. Brongersma
H 指数: 101 · 论文数: 489
M
Masakazu Aono
H 指数: 78 · 论文数: 669
G
G. Groeseneken
H 指数: 78 · 论文数: 1.3K
S
Sefaattin Tongay
H 指数: 78 · 论文数: 445
S
Stephen Jesse
H 指数: 76 · 论文数: 646
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