Vincent Goiffon - Publications, H-index & Citations

Vincent Goiffon

communaute d'universites et etablissements de toulouse

28H指数

216论文数

2.5K被引数

收录论文 13

发表时间

Non-Linear Dark Current Behavior in CMOS Image Sensor CMOS图像传感器中的非线性暗电流行为

IEEE Electron Device Letters

IF4.5

2026-09-01

PREAI

Kang, Jungwoo; Kang, Jeonwoong; Bak, Jiwon; Kim, Ganghyeon; Alj, Antoine Salih; Goiffon, Vincent; Lee, Jiwon

Infrared Nanocrystals for Space Application: Hardness to Irradiations 空间应用中的红外纳米晶体：抗辐照硬度

Advanced Functional Materials

IF19

2026-02-15

OAAI

Alexandre Neyret; Dario Mastrippolito; Bingbing Xia; Adrien Khalili; Maxime Lebreton; Giorgia Strobbia; Albin Colle; Marco Paye; Mariarosa Cavallo; Erwan Bossavit; Claire Abadie; Yoann Prado; Debora Pierucci; Victor Parahyba; Francois Coursaget; David Darson; Emrick Briand; Ian Vickridge; Stephane Demiguel; Sebastien Massenot; Jean-Marc Belloir; Vincent Goiffon; Emmanuel Lhuillier

Trapeze Active Deep Trench Designs for Enhanced Charge Transfer Performances in CCD-on-CMOS Image Sensor 高空飞杠式主动深沟槽设计，用于增强CCD-on-CMOS图像传感器的电荷转移性能

IEEE Sensors Journal

IF4.5

2026-01-01

PREAI

Antoine Salih Alj; Lucrezia Migliorin; Pierre Touron; Jean-Pierre Carrère; Julien Michelot; Stéphane Demiguel; Cédric Virmontois; Valérian Lalucaa; Pierre Magnan; Vincent Goiffon

Dark Current and Clock-Induced Charges in a Fully Depleted Charge Domain CDTI-Based CCD-on-CMOS Image Sensor

IEEE SENSORS JOURNAL

IF4.5

2024-08-15

PREAI

Alj, Antoine Salih; Touron, Pierre; Roy, Francois; Tournier, Arnaud; Michelot, Julien; Demiguel, Stephane; Virmontois, Cedric; Lalucaa, Valerian; Magnan, Pierre; Goiffon, Vincent

Radiation Damage on Silicon Photomultipliers from Ionizing and Non-Ionizing Radiation of Low-Earth Orbit Operations

SENSORS

IF3.5

2024-08-01

OAAI

Merzi, Stefano; Acerbi, Fabio; Aicardi, Corinne; Fiore, Daniela; Goiffon, Vincent; Gola, Alberto Giacomo; Marcelot, Olivier; Materne, Alex; Saint-Pe, Olivier

Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging 用于微光成像的基于电容沟槽的电荷倍增CMOS图像传感器的研制

SENSORS

IF3.5

2023-11-30

OAAI

Marcelot, Olivier; Morvan, Marjorie; Alj, Antoine Salih; Demiguel, Stephane; Virmontois, Cedric; Rouvie, Anne; Estribeau, Magali; Goiffon, Vincent

Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications

SENSORS

IF3.5

2023-06-25

OAAI

Durnez, Clementine; Virmontois, Cedric; Panuel, Pierre; Antonsanti, Aubin; Goiffon, Vincent; Estribeau, Magali; Saint-Pe, Olivier; Lalucaa, Valerian; Berdin, Erick; Larnaudie, Franck; Belloir, Jean-Marc; Codreanu, Catalin; Chavanne, Ludovic

Phosphosilicate Multimode Optical Fiber for Sensing and Diagnostics at Inertial Confinement Fusion Facilities 用于惯性约束聚变设施传感和诊断的磷硅酸盐多模光纤

IEEE SENSORS JOURNAL

IF4.5

2022-12-01

PREAI

Paillet, Philippe; Girard, Sylvain; Goiffon, Vincent; Duhamel, O.; Morana, Adriana; Lambert, Damien; De Michele, Vincenzo; Campanella, Cosimo; Melin, Gilles; Robin, Thierry; Vidalot, Jeoffray; Meyer, Arnaud; Boukenter, Aziz; Ouerdane, Youcef; Marin, Emmanuel; Glebov, Vladimir Yu.; Pien, Gregory

Automatic Detection and Correction of Random Telegraph Signal Artifacts in Earth Observation Images

ieee geoscience and remote sensing magazine

IF4.4

2022-01-01

PREAI

Lucas, Sylvain; Oberlin, Thomas; Goiffon, Vincent; Le Mer, Fanny

Finding Reaction Pathways and Transition States: r-ARTn and d-ARTn as an Efficient and Versatile Alternative to String Approaches

JOURNAL OF CHEMICAL THEORY AND COMPUTATION

IF5.5

2020-08-14

OAAI

Jay, Antoine; Huet, Christophe; Salles, Nicolas; Gunde, Miha; Martin-Samos, Layla; Richard, Nicolas; Landa, Georges; Goiffon, Vincent; De Gironcoli, Stefano; Hemeryck, Anne; Mousseau, Normand

Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage

SENSORS

IF3.5

2019-12-16

OAAI

Le Roch, Alexandre; Goiffon, Vincent; Marcelot, Olivier; Paillet, Philippe; Pace, Federico; Belloir, Jean-Marc; Magnan, Pierre; Virmontois, Cedric

Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors

SENSORS

IF3.5

2019-12-10

OAAI

Chao, Calvin Yi-Ping; Yeh, Shang-Fu; Wu, Meng-Hsu; Chou, Kuo-Yu; Honyih Tu; Lee, Chih-Lin; Yin, Chin; Paillet, Philippe; Goiffon, Vincent

Pixel pitch and particle energy influence on the dark current distribution of neutron irradiated CMOS image sensors

OPTICS EXPRESS

IF3.3

2016-02-19

OAAI

Belloir, Jean-Marc; Goiffon, Vincent; Virmontois, Cedric; Raine, Melanie; Paillet, Philippe; Duhamel, Olivier; Gaillardin, Marc; Molina, Romain; Magnan, Pierre; Gilard, Olivier

研究方向