Metal gate work function engineering using AlNx interfacial layers

doi:10.1063/1.2186517

Metal gate work function engineering using AlNx interfacial layers

2006-03-16

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DOI：10.1063/1.2186517

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Metal gate work function enhancement using thin AlNx interfacial layers has been evaluated. It was found that band edge effective work functions (similar to 5.10 eV) can be achieved on hafnium-based high dielectric constant (high-k) materials using the AlNx interfacial layer and TiSiN electrodes. It was also found that the effective work function enhancement by the AlNx interfacial layer increased when the concentration of SiO2 in the gate dielectric was increased. Thus, the enhancement was minimal for HfO2 and maximum for SiO2. A model is proposed to explain these results and a bonding analysis is presented to support the proposed model. (c) 2006 American Institute of Physics.

Metal gate work function engineering using AlNx interfacial layers

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