返回
Multicolor localization microscopy and point-spread-function engineering by deep learning
DOI:10.1364/OE.27.006158.png)
摘要
En 中文
Deep learning has become an extremely effective tool for image classification and image restoration problems. Here, we apply deep learning to microscopy and demonstrate how neural networks can exploit the chromatic dependence of the point-spread function to classify the colors of single emitters imaged on a grayscale camera. While existing localization microscopy methods for spectral classification require additional optical elements in the emission path, e.g., spectral filters, prisms, or phase masks, our neural net correctly identifies static and mobile emitters with high efficiency using a standard, unmodified single-channel configuration. Furthermore, we show how deep learning can be used to design new phase-modulating elements that, when implemented into the imaging path, result in further improved color differentiation between species, including simultaneously differentiating four species in a single image. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
Keyword:
SINGLE-MOLECULE MICROSCOPY
SUPERRESOLUTION
RESOLUTION
DEPLETION
NANOSCOPY
EMISSION
TRACKING
LIMIT
期刊
IF:
3.3
论文数:
6.1W
被引数:
14.3W
机构
引用论文
Sub-diffraction-limit imaging by stochastic optical reconstruction microscopy (STORM)通过随机光学重建显微镜 (STORM) 进行亚衍射极限成像
NATURE METHODS
IF32.1
High precision wavefront control in point spread function engineering for single emitter localization
OPTICS EXPRESS
IF3.3
Deep-STORM: super-resolution single-molecule microscopy by deep learningDeep-STORM: 通过深度学习实现超分辨率单分子显微镜
OPTICA
IF8.5
Deep learning massively accelerates super-resolution localization microscopy深度学习大规模加速超分辨率定位显微镜
NATURE BIOTECHNOLOGY
IF41.7

