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Hitachi Limited
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2.2K
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(1480)
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Identification of material parameters of shear-modified GTN model and improvement in reproducibility of pure shear fracture
International Journal of Pressure Vessels and Piping
IF
3.5
2026-05-23
0
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Yashirodai, Kenji; Nakane, Motoki
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Your Heart Foretells Your Performance: Analysis of Pre-Task Heart Rate in Program Comprehension Tasks
IEICE Transactions on Information and Systems
IF
0.8
2026-05-01
0
PRE
AI
Soga, Ryo; Kubo, Takatomi; Ishio, Takashi; Nunomura, Yuna; Kinoshita, Takahiro; Kanuka, Hideyuki; Matsumoto, Kenichi
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Fully Digital Calibration of Time-Interleaved A/D Converter with Cascaded Higher-Order Sampling-Timing Correction
IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences
IF
0.4
2026-05-01
0
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Nakamura, Yohei; Oshima, Takashi
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Investigation of Rotating Stall in Vaneless Diffuser of Single-Stage Centrifugal Blower Using Wall-Resolved Large Eddy Simulation
Journal of Turbomachinery-Transactions of the ASME
IF
3.1
2026-05-01
0
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Tsukamoto, Kazuhiro; Kato, Chisachi
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Data-Driven Exponential Framing for Pulsive Temporal Patterns Without Repetition or Singularity
JOURNAL OF DYNAMIC SYSTEMS MEASUREMENT AND CONTROL-TRANSACTIONS OF THE ASME
IF
1.3
2026-05-01
0
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Kono, Yohei; Tajima, Yoshiyuki
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Spring constant of an AFM cantilever with a thin-film plasmonic waveguide formed at its end (vol 63, 04SP59, 2024)
Japanese Journal of Applied Physics
IF
1.8
2026-04-30
0
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Ito, Masanao; Lang, Lang; Zhang, Kaifeng; Kobayashi, Kei
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Depth control of protective layer for HF gas etching via TMSDMA vapor exposure
Japanese Journal of Applied Physics
IF
1.8
2026-04-30
0
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Imamura, Tsubasa; Miyoshi, Nobuya; Kurosaki, Yosuke; Yamada, Masaki
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Occlusion robust 2D scan matching using template matching and ray tracing
ROBOMECH Journal
IF
1.7
2026-04-10
0
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Koyama, Ryo; Kimura, Nobutaka; Ishikawa, Shinichi; Inoue, Tomohiro; Koyama, Masahiro
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Iron Loss Reduction in Low-Cobalt Fe-Co Soft Magnetic Foils via Tensile Stress and Annealing Optimization
IEEE Transactions on Magnetics
IF
1.9
2026-04-01
0
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Tabata, Tomohiro; Asari, Yusuke; Nojima, Masafumi; Terada, Shohei
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Characterization of plasma-induced damage on TiN/HfO2/SiO2 stacked structure during multi-Vt process for advanced CMOS using different dry etching gas chemistry
Japanese Journal of Applied Physics
IF
1.8
2026-03-31
0
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Hirabayashi, Hidefumi; Sato, Kiyohiko; Kofuji, Naoyuki; Sakai, Satoshi; Matsui, Miyako; Kasai, Taiga; Miura, Makoto
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Efficient Accuracy Evaluation Methods for Lattice-Based Fuzzy Extractors and Fuzzy Signatures
IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences
IF
0.4
2026-03-01
0
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Nakamura, Wataru; Takahashi, Kenta
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Agent Fine-Tuning with Knowledge Distillation: Achieving Cost-Efficient and High-Fidelity LLMs in Microdomains
International Journal of Semantic Computing
IF
0.6
2026-03-01
0
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Xue, Yawen; Tsunokake, Masaya; Koreeda, Yuta; Sogawa, Yasuhiro
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Optimizing via Placement and Routing Structure to Improve Signal Integrity in DDR4 Fly-By Topology
IEEE Letters on Electromagnetic Compatibility Practice and Applications
IF
1
2026-03-01
0
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Hamamoto, Goro; Uematsu, Yutaka; Toyota, Yoshitaka
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Length-dependent electron-phonon nonequilibrium thermal resistance in metal-insulator superlattices
Journal of Applied Physics
IF
2.5
2026-02-28
0
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Kim, Kyoung Jung; Kurosaki, Yosuke; Fukatani, Naoto; Yabuuchi, Shin; Ira, Yusuke; Shao, Cheng; Hayakawa, Jun; Shiomi, Junichiro
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Advances in cyclic and pulsed etching for atomic-level control in next-generation logic device fabrication
Japanese Journal of Applied Physics
IF
1.8
2026-02-27
0
PRE
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Morimoto, Michikazu; Izawa, Masaru; Kuwahara, Kenichi; Matsui, Miyako
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Fast Evaluation of Deep Neural Network (DNN) for Past Dataset in Incremental Learning
EUROPEAN JOURNAL ON ARTIFICIAL INTELLIGENCE
IF
0
2026-02-01
0
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Sato, Naoto
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Semi-supervised semantic segmentation of SEM images considering multi-scale structural consistency loss in semiconductor pattern layouts
Microscopy
IF
1.9
2026-02-01
0
PRE
AI
Ito, Akira; Miyamoto, Atsushi
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Unsupervised Estimation of Lower Layer Pattern Regions Based on High Voltage-Scanning Electron Microscope Image Characteristics
IEEE Transactions on Semiconductor Manufacturing
IF
2.3
2026-02-01
0
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Sasaki, Goshi; Ishikawa, Masayoshi; Komatsu, Sota; Chen, Jun
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1.3 W Si-SiC Hybrid Linear Voltage Regulator With Gamma-Irradiation Resistance Over 3 MGy
IEEE Transactions on Nuclear Science
IF
1.9
2026-02-01
0
PRE
AI
Nomoto, Shinji; Masunaga, Masahiro; Kuwana, Ryo; Sasago, Yoshitaka; Shimizu, Kazuya; Hisamoto, Digh
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Approximation formula-embedded neural-network model incorporating operator expertise for flocculant-dosage estimation
WATER SCIENCE AND TECHNOLOGY
IF
2.6
2026-02-01
0
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Watanabe, Ayumi; Sangu, Yutaka; Embutsu, Ichiro; Sakimura, Shigetoshi; Yokoi, Hiroto; Nakamura, Nobuyuki
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