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Effects of SF6 Plasma Treatment Time on the Electrical Performance and Bias Stability of Dual-Gate ITZO Thin-Film Transistors Zhang, Tan; Li, Yuxiong; Zeng, Zhongming; Lv, Shaocong; Xin, Qian; Li, Yuxiang; Jin, Jidong; Song, Aimin; Lin, Yu; Ma, Xiaochen; Zhang, Jiawei Share Save
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Oxygen Plasma-Treated Dielectric-Channel Interface for BEOL-Compatible IGZO TFTs with High Electrical Stability Lv, Shaocong; Zheng, Shuaiying; Li, Xianglong; Zhang, Tan; Zhang, Baoqing; Feng, Huayu; Wang, Fei; Xin, Qian; Li, Yuxiang; Zhang, Jiawei; Song, Aimin Share Save
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Tailoring Al2O3 deposition temperature for enhanced electrical performance and reliability of IGZO thin-film transistors Lv, Shaocong; Li, Xianglong; Zheng, Shuaiying; Zhang, Tan; Zhang, Baoqing; Lin, Yu; Wang, Yiming; Wang, Fei; Xin, Qian; Li, Yuxiang; Song, Aimin; Jin, Jidong; Zhang, Jiawei Share Save
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Light-Triggered Anti-ambipolar Transistor Based on an In-Plane Lateral Homojunction Han, Hecheng; Zhang, Baoqing; Zhang, Zihao; Wang, Yiming; Liu, Chuan; Singh, Arun Kumar; Song, Aimin; Li, Yuxiang; Jin, Jidong; Zhang, Jiawei Share Save
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