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SaveGate failure process and mechanism of SiC MOSFETs under the effect of multiphysics field during short-circuit transients
Tang, Yuting; Ren, Min; Zhang, Xin; Zheng, Fang; Luo, Yuchu; Tao, Ye; Nie, Nan; Liu, Zhihai; Zhang, Anna; Ma, Rongyao; Li, Zehong; Zhang, Bo
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