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SaveA reliability-noise-delay quantification method for APUF physical modeling and CRPs screening
Huang, Zhengfeng; Liu, Ruixiang; Wang, Zezheng; Zhu, Yanrong; Bian, Jingchang; Yang, Zhao; Lu, Yingchun; Ouyang, Yiming; Liang, Huaguo; Ni, Tianming
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