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J

Jungsik Kim

Gyeongsang National University

21H指数
120论文数
1.3K被引数
收录论文 34
发表时间
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Hole Trap Extraction in Charge Trap Layer of 3-D nand Flash Memory
errIEEE Transactions on Electron Devices
IF3.2
err2025-12-30
err0
PREAI
errDonghyun Go; Jounghun Park; Donghwi Kim; Jinuk Ju; Seungjae Kim; Jungsik Kim; Jeong-Soo Lee
err分享
err收藏
Radiation effect in FD-SOI nanowire FETs due to high dose rate gamma-ray under variable irradiation temperatures高剂量率伽马射线在变辐照温度下对FD-SOI纳米线FET的辐射效应
errMICROELECTRONICS RELIABILITY
IF1.9
err2025-11-01
err0
PREAI
errHa, Jonghyeon; Suh, Minki; Ryu, Minsang; Lee, Dabok; Jeon, Dae-Young; Kim, Jungsik
err分享
err收藏
Analysis of Charge Loss Decomposition and Nonlinear Ea in 3-D NAND Flash Memory Using a Neutral Cell-Based Method基于中性单元法的3-D NAND闪存电荷损失分解和非线性Ea分析
errIEEE Electron Device Letters
IF4.5
err2025-10-16
err0
PREAI
errJounghun Park; Donghyun Go; Donghwi Kim; Jungsik Kim; Jeong-Soo Lee
err分享
err收藏
A Scalable 16-Element and 45.5 dBm-EIRP D-Band CMOS Phased-Array Transceiver Integrated With Antenna-in-Package for 6G Communications可扩展的16元件和45.5 dbm-eirp D波段CMOS相控阵收发器，集成了封装天线，用于6g通信
errIEEE ACCESS
IF3.6
err2025-01-01
err0
errOAAI
errNam, Hyohyun; Kim, Hyeongjin; Oh, Sungjae; Kim, Jungsik; Lee, Chae Jun; Kim, Meeran; Lee, Hee Sung; Kim, Seung Hun; Kwon, Jaekwang; Yeom, Kyeongho; Jung, Dongjin; Kim, Dongki; Kim, Seong-Kyun; Lee, Dae Young
err分享
err收藏
Soft Error in Saddle Fin-Based DRAM at Cryogenic Temperature鞍形鳍式DRAM在低温下的软错误
errIEEE Access
IF3.6
err2025-01-01
err0
errOAAI
errMinsang Ryu; Minki Suh; Jonghyeon Ha; Minji Bang; Dabok Lee; Hojoon Lee; Hyunchul Sagong; Dong-Seok Kim; Jungsik Kim
err分享
err收藏
Effect of Quasi-One-Dimensional Properties on Source/Drain Contacts in Vertical Nanowire Field-Effect Transistors (VNWFETs)
errMICROMACHINES
IF3
err2024-03-30
err0
errOAAI
errPark, Iksoo; Choi, Jaeyong; Kim, Jungsik; Kong, Byoung Don; Lee, Jeong-Soo
err分享
err收藏
Comprehensive Hammering and Parasitic BJT Effects in Vertically Stacked DRAM
errIEEE ACCESS
IF3.6
err2024-01-01
err0
errOAAI
errSuh, Minki; Ryu, Minsang; Ha, Jonghyeon; Bang, Minji; Lee, Dabok; Lee, Hojoon; Sagong, Hyunchul; Kim, Jungsik
err分享
err收藏
Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell
errIEEE ACCESS
IF3.6
err2024-01-01
err0
errOAAI
errBang, Minji; Ha, Jonghyeon; Suh, Minki; Lee, Dabok; Ryu, Minsang; Han, Jin-Woo; Sagong, Hyunchul; Lee, Hojoon; Kim, Jungsik
err分享
err收藏
Effect of Noncircular Channel on Distribution of Threshold Voltage in 3D NAND Flash Memory
errMICROMACHINES
IF3
err2023-10-28
err0
errOAAI
errGo, Donghyun; Yoon, Gilsang; Park, Jounghun; Kim, Donghwi; Kim, Jiwon; Kim, Jungsik; Lee, Jeong-Soo
err分享
err收藏
Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defects
errMICROMACHINES
IF3
err2023-05-22
err1
errOAAI
errBang, Minji; Ha, Jonghyeon; Lee, Gyeongyeop; Suh, Minki; Kim, Jungsik
err分享
err收藏
Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects
errIEEE ACCESS
IF3.6
err2023-01-01
err1
errOAAI
errLee, Gyeongyeop; Suh, Minki; Ryu, Minsang; Lee, Yunjong; Han, Jin-Woo; Kim, Jungsik
err分享
err收藏
Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory
errIEEE ACCESS
IF3.6
err2023-01-01
err1
errOAAI
errHa, Jonghyeon; Bang, Minji; Lee, Gyeongyeop; Suh, Minki; Kim, Chong-Eun; Kim, Jungsik
err分享
err收藏
Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Models
errIEEE ACCESS
IF3.6
err2023-01-01
err1
errOAAI
errHa, Jonghyeon; Kim, Sun Jin; Bang, Minji; Lee, Gyeongyeop; Suh, Minki; Shim, Minseob; Kim, Chong-Eun; Kim, Jungsik
err分享
err收藏
Overhang Saddle Fin Sidewall Structure for Highly Reliable DRAM Operation
errIEEE ACCESS
IF3.6
err2023-01-01
err5
errOAAI
errHan, Jin-Woo; Suh, Minki; Lee, Gyeongyeop; Kim, Jungsik
err分享
err收藏
On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FET
errMICROMACHINES
IF3
err2022-08-08
err0
errOAAI
errHa, Jonghyeon; Lee, Gyeongyeop; Bae, Hagyoul; Kim, Kihyun; Han, Jin-Woo; Kim, Jungsik
err分享
err收藏
Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors1.2 kV SiC金属氧化物半导体场效应晶体管中辐射诱导位移缺陷的影响
errMICROMACHINES
IF3
err2022-06-07
err8
errOAAI
errLee, Gyeongyeop; Ha, Jonghyeon; Kim, Kihyun; Bae, Hagyoul; Kim, Chong-Eun; Kim, Jungsik
err分享
err收藏
Improvement of Fermi-Level Pinning and Contact Resistivity in Ti/Ge Contact Using Carbon Implantation
errMICROMACHINES
IF3
err2022-01-10
err3
errOAAI
errPark, Iksoo; Lee, Donghun; Jin, Bo; Kim, Jungsik; Lee, Jeong-Soo
err分享
err收藏
Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling Oxide of 3D NAND Flash Memory
errIEEE ACCESS
IF3.6
err2022-01-01
err5
errOAAI
errYoon, Gilsang; Ko, Donghyun; Park, Jounghun; Kim, Donghwi; Kim, Jungsik; Lee, Jeong-Soo
err分享
err收藏
Effects of Carbon Incorporation on Electrical Characteristics and Thermal Stability of Ti/TiO2/n-Ge MIS Contact
errIEEE ACCESS
IF3.6
err2022-01-01
err0
errOAAI
errPark, Iksoo; Shin, Seonghwan; Kim, Jungsik; Jin, Bo; Lee, Jeong-Soo
err分享
err收藏
Novel Program Scheme of Vertical NAND Flash Memory for Reduction of Z-Interference
errMICROMACHINES
IF3
err2021-05-20
err14
errOAAI
errYi, Su-in; Kim, Jungsik
err分享
err收藏

研究方向

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合作学者
合作期刊
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H 指数: 92 · 论文数: 847
F
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J
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H 指数: 38 · 论文数: 412
J
Jin‐Woo Han
H 指数: 38 · 论文数: 206
D
Dong‐Hun Lee
H 指数: 36 · 论文数: 407
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