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Luigi Balestra

university of bologna

4H指数
22论文数
47被引数
收录论文 3
发表时间
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Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD InsightsAlScN/GaN HEMT器件在脉冲测量和HTRB步进应力测试下的可靠性：实验与TCAD分析
errIEEE Journal of the Electron Devices Society
IF2.4
err2026-01-01
err0
PREAI
errErcolano, Franco; Balestra, Luigi; Krause, Sebastian; Leone, Stefano; Streicher, Isabel; Waltereit, Patrick; Dammann, Michael; Reggiani, Susanna
err分享
err收藏
Impact of interface traps on the subthreshold performance of InGaAs nanosheet transistors
errSOLID-STATE ELECTRONICS
IF1.4
err2025-10-01
err0
errOAAI
errBalestra, Luigi; Di Stasi, Simone; Gnani, Elena; Reggiani, Susanna; Chen, Mu-Yu; Iwai, Hiroshi; Chang, Edward Yi
err分享
err收藏
TCAD Modeling of High-Field Electron Transport in Bulk Wurtzite GaN: The Full-Band SHE-BTE
errIEEE ACCESS
IF3.6
err2023-01-01
err0
errOAAI
errBalestra, Luigi; Ercolano, Franco; Gnani, Elena; Reggiani, Susanna
err分享
err收藏

研究方向

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合作学者
合作期刊
E
Edward Yi Chang
H 指数: 56 · 论文数: 1.0K
P
Patrick Waltereit
H 指数: 37 · 论文数: 224
H
Hiroshi Iwai
H 指数: 35 · 论文数: 291
S
Susanna Reggiani
H 指数: 33 · 论文数: 289
E
Elena Gnani
H 指数: 31 · 论文数: 259
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