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Hanjin Lim

samsung electronics co., ltd.

19H指数
107论文数
1.1K被引数
收录论文 17
发表时间
Does a Morphotropic Phase Boundary Exist in ZrxHf1-xO2-Based Thin Films?ZrxHf1-xO2基薄膜中是否存在形变畴相界?
err2025-10-26
err0
errOAAI
errPramoda Vishnumurthy; Richard Ganser; Dong-Gyu Kim; Intak Jeon; Chang Hwa Jung; Hanjin Lim; Thomas Mikolajick; Susan Trolier-McKinstry; Alfred Kersch; Uwe Schroeder
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Field-Induced Structural Dynamics of Polarization Switching in HfxZr1-xO2 Thin FilmsHfxZr1-xO2薄膜中极化反转的场致结构动力学
err2025-09-25
err0
PREAI
errSangjun Lee; Sunghyun Kim; Seong Yong Park; Donghyun Kim; Su Yong Lee; Daseul Ham; Hyun Hwi Lee; Dongjin Yun; Seontae Park; Soohwan Sul; Seungjin Kang; Geonu Kim; Duk-Hyun Choe; Jooho Lee; Beomseok Kim; Jinseong Heo; Hyung-Suk Jung; Hanjin Lim; Wonsik Choi; Jeong-Gyu Song
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HfO2-based ferroelectric synaptic devices: challenges and engineering solutions (vol 61, pg 3061, 2025)
err2025-01-01
err0
errOAAI
errKwon, Taegyu; Choi, Hyeong Seok; Lee, Dong Hyun; Han, Dong Hee; Cho, Yong Hyeon; Jeon, Intak; Jung, Chang Hwa; Lim, Hanjin; Moon, Taehwan; Park, Min Hyuk
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A Route to MoO2 film fabrication via atomic layer deposition using Mo(IV) precursor and oxygen reactant for DRAM applications
err2024-04-01
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PREAI
errYoon, Ara; Yang, Hae Lin; Lee, Sanghoon; Lee, Seunghwan; Kim, Beomseok; Jung, Changhwa; Lim, Hanjin; Park, Jin-Seong
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Atomic layer deposition of molybdenum oxide using (NtBu)2(NMe2)2Mo, hydrogen peroxide (H2O2), and ozone (O3) for DRAM application
err2023-02-01
err13
PREAI
errLee, Seunghwan; Yang, Hae Lin; Kim, Beomseok; Lee, Jinho; Lim, Hanjin; Park, Jin-Seong
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Study of Metal-Dielectric Interface for Improving Electrical Properties and Reliability of DRAM Capacitor金属-介质界面改善DRAM电容器电性能和可靠性的研究
err2022-07-10
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PREAI
errLim, HanJin; Choi, Jae Hyoung; Cho, Gihee; Chang, Jaewan; Kim, Younsoo; Jung, Hyung-Suk; Shin, Kyoung-Sub; Seo, Hyungtak; Jeon, Hyeongtag
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Structure of Li5AlS4 and comparison with other lithium-containing metal sulfides
err2018-01-01
err18
PREAI
errLim, Hanjin; Kim, Sung-Chul; Kim, Jaegyeom; Kim, Young-Il; Kim, Seung-Joo
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Depth resolved band alignments of ultrathin TiN/ZrO2 and TiN/ZrO2-Al2O3-ZrO2 dynamic random access memory capacitors
err2014-11-18
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PREAI
errLee, Sang Yeon; Chang, Jaewan; Kim, Younsoo; Lim, HanJin; Jeon, Hyeongtag; Seo, Hyungtak
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