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Been Kwak

department of electrical engineering

6H指数
33论文数
93被引数
收录论文 16
发表时间
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Defect-mediated generation–recombination dynamics governing conductance response in floating-body transistors缺陷介导的产生-复合动力学主导浮体晶体管中的电导响应
errMicrosystems & Nanoengineering
IF9.9
err2026-08-04
err0
errOAAI
errBeen Kwak; Changhyeon Han; Hwoibin You; Wongi Hong; Joonhyeok Choi; Youngchan Cho; Sangwan Kim; Wonjun Shin; Daewoong Kwon
err分享
err收藏
A ferroelectric-ionic-trapping transistor for low power and secure neuromorphic computing铁电-离子捕获晶体管用于低功耗和安全神经形态计算
errNature Communications
IF15.7
err2026-05-29
err0
errOAAI
errChanghyeon Han; Youngchan Cho; Dongbin Kim; Se-Hyun Hwang; Minsuk Song; Been Kwak; David Radermacher; Min Wook Kang; Sangwan Kim; Jangsaeng Kim; Wonjun Shin; Daewoong Kwon
err分享
err收藏
Hybrid ferroelectric-ionic memristive hardware for high scalability in-memory computing铁电-离子混合忆阻器硬件用于高可扩展性存内计算
errNature Communications
IF15.7
err2026-05-21
err0
errOAAI
errJeong-Han Kim; Wonjun Shin; Ryun-Han Koo; Jangsaeng Kim; Eugene Park; Piush Behera; Sojin Kim; Jinseok Hong; Feras Al-Dirini; Been Kwak; Jiwon You; Jiseong Im; Dooyong Koh; Yejin Hong; Qinyuan Xue; Hyun-Min Kim; Hyunho Seok; Youngchan Cho; Hwiin Ju; Wooje Jung; Kyunghwan Lee; Daewon Ha; Jong-Ho Lee; Seung-Yong Lee; Deok-Hwang Kwon; Frances M. Ross; Youngho Kang; Suraj S. Cheema; Daewoong Kwon
err分享
err收藏
A novel observation of negative differential resistance in a standard CMOS transistor and its application to a compact frequency doubler在标准CMOS晶体管中负微分电阻现象的新观测及其在紧凑型倍频器中的应用
errMicrosystems & Nanoengineering
IF9.9
err2026-05-20
err0
errOAAI
errBeen Kwak; Youngchan Cho; Changhyeon Han; Jongwoo Lee; Sangwan Kim; Yunho Shin; Joonhyeok Choi; Dongbin Kim; Seung June Lee; Seunghoo Lee; Hyun-Min Kim; Wonjun Shin; Daewoong Kwon
err分享
err收藏
Memory Window Expansion in HfO2-Based FeFETs Through Trap-to-Dipole Conversion通过陷阱-偶极子转换在HfO2基FeFETs中扩展存储窗口
errIEEE Electron Device Letters
IF4.5
err2026-04-28
err0
PREAI
errChanghyeon Han; Been Kwak; Hyun-Min Kim; Sangeun Kwak; Daewoong Kwon
err分享
err收藏
Repurposing Si CMOS nonidealities for stochastic and analog image processing利用Si CMOS非理想特性进行随机和模拟图像处理
errScience Advances
IF12.5
err2026-02-20
err0
errOAAI
errBeen Kwak; Ryun-Han Koo; Changhyeon Han; Yunho Shin; Joonhyeok Choi; Dongbin Kim; Jongwoo Lee; Jiseong Im; Youngchan Cho; Jong-Ho Lee; Wonjun Shin; Daewoong Kwon
err分享
err收藏
Interface-Engineered TiO2 Interlayer for Reliable Hafnia-Based MFMIS FeFETs界面工程化的TiO2中间层用于可靠的氧化铪基MFMIS FeFETs
errAdvanced Electronic Materials
IF5.3
err2026-02-02
err0
errOAAI
errChanghyeon Han; Been Kwak; Hyun-Min Kim; Dahye Yu; Daewoong Kwon
err分享
err收藏
Degradation and Recovery in HZO-Based FeFETs under Hydrogen and Thermal Stress for CMOS Integration
errACS Applied Electronic Materials
IF4.7
err2026-01-23
err0
PREAI
errChanghyeon Han; Been Kwak; Yelin Yoo; Sangeun Kwak; Daewoong Kwon
err分享
err收藏
In Materia Shaping of Randomness with a Standard Complementary Metal-Oxide-Semiconductor Transistor for Task-Adaptive Entropy Generation
errADVANCED FUNCTIONAL MATERIALS
IF19
err2025-12-01
err0
errOAAI
errKwak, Been; Koo, Ryun-Han; Cho, Youngchan; Han, Changhyeon; Kim, Dongbin; Jeong, Soi; Shin, Yunho; Choi, Joonhyeok; Im, Jiseong; Ko, Jonghyun; Lee, Jong-Ho; Kim, Jangsaeng; Kang, Youngho; Shin, Wonjun; Kwon, Daewoong
err分享
err收藏
Unraveling ionic switching dynamics in high-k dielectric double-gate transistors via low-frequency noise spectroscopy通过低频噪声谱学解析高k介电双栅晶体管中的离子开关动力学
errNano Convergence
IF11
err2025-10-03
err0
errOAAI
errSoi Jeong; Chang-Hyeon Han; Been Kwak; Ryun-Han Koo; Youngchan Cho; Jangsaeng Kim; Jong-Ho Lee; Daewoong Kwon; Wonjun Shin
err分享
err收藏
Corrigendum to “Structure-modulated phase stability and defect engineering in ferroelectric HfxZr1-xO2 heterostructures” [Mater. Sci. Semicond. 200 (2025) 109995]勘误：“Structure-modulated phase stability and defect engineering in ferroelectric HfxZr1-xO2 heterostructures” [Mater. Sci. Semicond. 200 (2025) 109995]
errMaterials Science in Semiconductor Processing
IF4.6
err2025-09-27
err0
PREAI
errChanghyeon Han; Been Kwak; Joonhyeok Choi; Hyucknam Kwon; Ki-Ryun Kwon; Rino Choi; Daewoong Kwon
err分享
err收藏
Synergistic Modulation of Polarization and Leakage Current in MPB-HZO Capacitors via TiO2 Interlayer通过TiO2中间层协同调控MPB-HZO电容器的极化和漏电流
errAdvanced Electronic Materials
IF5.3
err2025-09-27
err0
errOAAI
errChanghyeon Han; Been Kwak; Joonhyeok Choi; Sung-Wook Park; Dahye Yu; Minsuk Song; Rino Choi; Daewoong Kwon
err分享
err收藏
Structure-modulated phase stability and defect engineering in ferroelectric HfxZr1-xO2 heterostructures结构调控的相稳定性与缺陷工程在铁电HfxZr1-xO2异质结构中
errMaterials Science in Semiconductor Processing
IF4.6
err2025-08-30
err0
PREAI
errChanghyeon Han; Been Kwak; Joonhyeok Choi; Hyucknam Kwon; Ki-Ryun Kwon; Rino Choi; Daewoong kwon
err分享
err收藏
Ultrathin TiO2-interfaced hafnia ferroelectric transistor for large-scale neuromorphic computing超薄TiO2界面铪基铁电晶体管用于大规模神经形态计算
errNano Energy
IF17.1
err2025-06-09
err0
PREAI
errChanghyeon Han; Ryun-Han Koo; Wonjun Shin; Jangsaeng Kim; Been Kwak; Jiseong Im; Sojin Kim; Seung-Yong Lee; Youngho Kang; Daewoong Kwon
err分享
err收藏
Low-Frequency Noise Spectroscopy for Navigating Geometrically Varying Strain Effects in HfO2 Ferroelectric FETs用于导航HfO2铁电fet中几何变化的应变效应的低频噪声光谱
errADVANCED SCIENCE
IF14.1
err2025-04-02
err0
errOAAI
errKoo, RH; Shin, W; Kim, S; Kim, J; Kwak, B; Im, J; Kim, H; Kwon, DH; Cheema, SS; Lee, JH; Kwon, D
err分享
err收藏
Effects of temperature and DC cycling stress on resistive switching mechanisms in hafnia-based ferroelectric tunnel junction
errAPPLIED PHYSICS LETTERS
IF3.6
err2023-04-10
err7
PREAI
errShin, Wonjun; Koo, Ryun-Han; Min, Kyung Kyu; Kwak, Been; Kwon, Dongseok; Kwon, Daewoong; Lee, Jong-Ho
err分享
err收藏

研究方向

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合作学者
合作期刊
J
Jong-Ho Lee
H 指数: 66 · 论文数: 969
F
Frances M. Ross
H 指数: 57 · 论文数: 330
J
Jong‐Ho Lee
H 指数: 46 · 论文数: 822
R
Rino Choi
H 指数: 45 · 论文数: 385
Y
Youngho Kang
H 指数: 30 · 论文数: 140
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