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收藏High-energy krypton-ion irradiation-induced stress and strain in AlGaN/GaN heterojunctions and latent tracks in devices高能氪离子辐照诱导的AlGaN/GaN异质结中应力与应变及器件中的潜径迹
Wang, Wenfeng; Zou, Can; Zhou, Feng; Qian, Junfan; Shu, Chongrui; Yu, Yiteng; Xu, Weizong; Ren, Fangfang; Zhou, Dong; Chen, Dunjun; Zhang, Rong; Zheng, Youdou; Lu, Hai
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收藏Reliability Performance Study of SiC, GaN, and Si Photodetectors Under High-Dose UV IrradiationSiC、GaN和Si光电探测器在高剂量UV辐射下的可靠性性能研究
He, Yunjing; Zhou, Dong; Xu, Weizong; Zhou, Feng; Ren, Fangfang; Chen, Dunjun; Zhang, Rong; Zheng, Youdou; Lu, Hai
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收藏Highly Reliable SiC UV SPAD With Over 10000 h of Continuous Operation
Zhou, Yan; Tao, Xiaoqiang; Li, Tianyi; Zhou, Dong; Xu, Weizong; Zhou, Feng; Ren, Fangfang; Chen, Dunjun; Zhang, Rong; Zheng, Youdou; Lu, Hai
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收藏150 °C Compatible 4H-SiC Junction Transistor for the Precise Analog Analysis on 0.1-pC-Level Charge Signals With 0.7% Standard Error
Zhao, Jiuzhou; Xu, Weizong; Qu, Hao; Zhou, Dong; Ren, Fangfang; Zhou, Feng; Chen, Dunjun; Zhang, Rong; Zheng, Youdou; Lu, Hai
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