Jin-Su Shin - Publications, H-index & Citations | 科言猫

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J

Jin-Su Shin

sungkyunkwan university (skku)

3H指数

6论文数

32被引数

收录论文 3

发表时间

A framework for detecting unknown defect patterns on wafer bin maps using active learning 使用主动学习检测晶圆bin图上未知缺陷模式的框架

EXPERT SYSTEMS WITH APPLICATIONS

IF7.5

2025-01-01

1

PREAI

Shin, Jin-Su; Kim, Min-Joo; Lee, Dong-Hee

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Enhanced detection of unknown defect patterns on wafer bin maps based on an open-set recognition approach 基于开集识别方法的晶圆仓图上未知缺陷模式的增强检测

COMPUTERS IN INDUSTRY

IF9.1

2025-01-01

1

PREAI

Shin, Jin-Su; Kim, Min-Joo; Kim, Beom-Seok; Lee, Dong-Hee

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Similarity searching for wafer bin maps by measuring shape, location, and size similarities of defect patterns 通过测量缺陷图案的形状，位置和尺寸相似性来搜索晶圆仓图

COMPUTERS & INDUSTRIAL ENGINEERING

IF6.5

2024-10-01

0

PREAI

Kang, Min-Su; Shin, Jin-Su; Lee, Dong-Hee

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