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S

Salvador Mir

communaute universite grenoble alpes

20H指数
338论文数
1.5K被引数
收录论文 3
发表时间
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3D simulation of charge defect impact on an industrial 28 nm FD-SOI quantum dot3D模拟电荷缺陷对工业级28 nm FD-SOI量子点的影响
errSOLID-STATE ELECTRONICS
IF1.4
err2025-11-01
err0
PREAI
errBureau, Benjamin; Beaudoin, Felix; Philippopoulos, Pericles; Mir, Salvador; Dupont-Ferrier, Eva; Galy, Philippe
err分享
err收藏
A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΔΣ ADC
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2016-11-01
err18
errOAAI
errBarragan, Manuel J.; Alhakim, Rshdee; Stratigopoulos, Haralampos-G.; Dubois, Matthieu; Mir, Salvador; Le Gall, Herve; Bhargava, Neha; Bal, Ankur
err分享
err收藏
Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test Technique
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2015-10-01
err21
errOAAI
errLaraba, Asma; Stratigopoulos, Haralampos-G.; Mir, Salvador; Naudet, Herve
err分享
err收藏

研究方向

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合作学者
合作期刊
H
Haralampos‐G. Stratigopoulos
H 指数: 24 · 论文数: 176
F
F. Beaudoin
H 指数: 18 · 论文数: 164
M
Manuel J. Barragán
H 指数: 14 · 论文数: 157
P
Philippe Galy
H 指数: 14 · 论文数: 176
E
Eva Dupont-Ferrier
H 指数: 9 · 论文数: 60
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