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J

James Dekker

vtt technical research center finland

19H指数
95论文数
1.1K被引数
收录论文 9
发表时间
High-fidelity patterning of AlN and ScAlN thin films with wet chemical etching
err2022-05-01
err17
errOAAI
errAirola, Konsta; Mertin, Stefan; Likonen, Jari; Hartikainen, Enni; Mizohata, Kenichiro; Dekker, James; Sebastian, Abhilash Thanniyil; Pensala, Tuomas
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Multiplexed mycotoxins determination employing white light reflectance spectroscopy and silicon chips with silicon oxide areas of different thickness
err2020-04-01
err25
PREAI
errAnastasiadis, Vasileios; Koukouvinos, Georgios; Petrou, Panagiota S.; Economou, Anastasios; Dekker, James; Harjanne, Mikko; Heimala, Paivi; Goustouridis, Dimitris; Raptis, Ioannis; Kakabakos, Sotirios E.
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Reducing stiction in microelectromechanical systems by rough nanometer-scale films grown by atomic layer deposition通过原子层沉积生长的粗糙纳米级薄膜减少微机电系统中的静摩擦
err2012-12-01
err14
PREAI
errPuurunen, R. L.; Haara, A.; Saloniemi, H.; Dekker, J.; Kainlauri, M.; Pohjonen, H.; Suni, T.; Kiihamaki, J.; Santala, E.; Leskela, M.; Kattelus, H.
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Site-Selective Self Assembly of Colloidal Photonic Crystals
err2009-04-20
err22
PREAI
errArpiainen, Sanna; Jonsson, Fredrik; Dekker, James R.; Kocher, Gudrun; Khunsin, Worawut; Torres, Clivia M. Sotomayor; Ahopelto, Jouni
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Dry-etchced silicon-on-insulator waveguides with low propagation and fiber-coupling losses
err2005-11-01
err31
PREAI
errSolehmainen, K; Aalto, T; Dekker, J; Kapulainen, M; Harjanne, M; Kukli, K; Heimala, P; Kolari, K; Leskelä, M
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Observation of interface defects in thermally oxidized SiC using positron annihilation
err2003-03-31
err28
PREAI
errDekker, J; Saarinen, K; Olafsson, H; Sveinbjörnsson, EÖ
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