Josef Lutz - Publications, H-index & Citations

Josef Lutz

Technische Universitat Chemnitz

35H指数

286论文数

5.3K被引数

收录论文 9

发表时间

On the Reverse Recovery of SiC MOSFET Inverse Diodes 关于SiC MOSFET反向二极管的反向恢复

IEEE Transactions on Electron Devices

IF3.2

2026-03-01

PREAI

Lutz, J.; Maitra, A.; Mysore, M. L.; Baumler, C.; Basler, T.

Fatigue Crack Networks in Die-Attach Layers of IGBT Modules Under a Power Cycling Test

IEEE TRANSACTIONS ON POWER ELECTRONICS

IF6.5

2024-12-01

OAAI

Liu, Shenyi; Vuorinen, Vesa; Liu, Xing; Fredrikson, Olli; Brand, Sebastian; Tiwary, Nikhilendu; Lutz, Josef; Paulasto-Krockel, Mervi

High Cycle Fatigue Testing of Silicon IGBT Devices Under Application-Close Conditions

IEEE TRANSACTIONS ON POWER ELECTRONICS

IF6.5

2023-11-01

PREAI

Schwabe, Christian; Thoenelt, Nick; Lutz, Josef; Basler, Thomas

Study on the IGBT Short Circuit Type II Behavior Considering the Plasma Effect

IEEE TRANSACTIONS ON POWER ELECTRONICS

IF6.5

2023-01-01

PREAI

Liu, Xing; Mysore, Madhu-Lakshman; Lutz, Josef; Basler, Thomas

Temperature Influence on the Accuracy of the Transient Dual Interface Method for the Junction-to-Case Thermal Resistance Measurement 温度对瞬态双界面法测量结-壳热阻的准确性的影响

IEEE TRANSACTIONS ON POWER ELECTRONICS

IF6.5

2021-07-01

PREAI

Deng, Erping; Chen, Weinan; Heimler, Patrick; Lutz, Josef

Correction of Delay-Time-Induced Maximum Junction Temperature Offset During Electrothermal Characterization of IGBT Devices

IEEE TRANSACTIONS ON POWER ELECTRONICS

IF6.5

2021-03-01

PREAI

Deng, Erping; Borucki, Ludger; Lutz, Josef

The Influence of the Gate Driver and Common-Source Inductance on the Short-Circuit Behavior of IGBT Modules and Protection

IEEE TRANSACTIONS ON POWER ELECTRONICS

IF6.5

2020-10-01

PREAI

Liu, Xing; Kowalsky, Jens; Herrmann, Clemens; Baeumler, Christia; Lutz, Josef

Experimental Investigation of Linear Cumulative Damage Theory With Power Cycling Test

IEEE TRANSACTIONS ON POWER ELECTRONICS

IF6.5

2019-05-01

PREAI

Zeng, Guang; Herold, Christian; Methfessel, Torsten; Schaefer, Marc; Schilling, Oliver; Lutz, Josef

Difference in Device Temperature Determination Using p-n-Junction Forward Voltage and Gate Threshold Voltage

IEEE TRANSACTIONS ON POWER ELECTRONICS

IF6.5

2019-03-01

PREAI

Zeng, Guang; Cao, Haiyang; Chen, Weinan; Lutz, Josef

研究方向