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T

Tae Bong Eom

korea research institute of standards & science (kriss)

13H指数
48论文数
583被引数
收录论文 6
发表时间
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Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method
errMEASUREMENT
IF5.6
err2018-03-01
err8
PREAI
errKim, Jong-Ahn; Kim, Jae Wan; Kang, Chu-Shik; Jin, Jonghan; Eom, Tae Bong
err分享
err收藏
Absolute angle measurement using a phase-encoded binary graduated disk
errMEASUREMENT
IF5.6
err2016-02-01
err51
PREAI
errKim, Jong-Ahn; Kim, Jae Wan; Kang, Chu-Shik; Jin, Jonghan; Eom, Tae Bong
err分享
err收藏
Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry
errOPTICS EXPRESS
IF3.3
err2014-03-12
err15
errOAAI
errKim, Jong-Ahn; Kim, Jae Wan; Eom, Tae Bong; Jin, Jonghan; Kang, Chu-Shik
err分享
err收藏
Thickness and refractive index measurement of a silicon wafer based on an optical comb
errOPTICS EXPRESS
IF3.3
err2010-08-12
err95
errOAAI
errJin, Jonghan; Kim, Jae Wan; Kang, Chu-Shik; Kim, Jong-Ahn; Eom, Tae Bong
err分享
err收藏
Measurement of refractive index and thickness of transparent plate by dual-wavelength interference
errOPTICS EXPRESS
IF3.3
err2010-04-21
err75
errOAAI
errChoi, Hee Joo; Lim, Hwan Hong; Moon, Han Seb; Eom, Tae Bong; Ju, Jung Jin; Cha, Myoungsik
err分享
err收藏
High speed phase shifting interferometry using injection locking of the laser frequency to the resonant modes of a confocal Fabry-Perot cavity
errOPTICS EXPRESS
IF3.3
err2009-01-23
err6
errOAAI
errKang, Chu-Shik; Kim, Jong-Ahn; Eom, Tae Bong; Jang, Roma; Park, Hae Yong; Kim, Jae Wan
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
H
Han Seb Moon
H 指数: 28 · 论文数: 240
J
Jonghan Jin
H 指数: 23 · 论文数: 142
C
Chu-Shik Kang
H 指数: 22 · 论文数: 118
H
Hae Yong Park
H 指数: 21 · 论文数: 129
J
Jong-Ahn Kim
H 指数: 20 · 论文数: 95
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