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A

Andrea Padovani

university of modena and reggio emilia

34H指数
302论文数
6.1K被引数
收录论文 25
发表时间
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Quantum tunnelling and leakage current across two-dimensional materials二维材料中的量子隧穿和漏电流
errNature Materials
IF38.5
err2026-07-01
err0
PREAI
errYue Yuan; Francesco Maria Puglisi; Andrea Padovani; Christoph Reuter; Tingting Han; Daria Belotcerkovtceva; Iakov Reznikov; Alexey Berdyugin; Yaqing Shen; Mahdi Pourfath; Theresia Knobloch; Marco A. Villena; Lukas Völkel; Max C. Lemme; Tibor Grasser; Deji Akinwande; Mario Lanza
err分享
err收藏
A Dual-Memory Ferroelectric Transistor Emulating Synaptic Metaplasticity for High-Speed Reservoir Computing双存储器铁电晶体管模拟突触超塑性以实现高速随机计算
errAdvanced Electronic Materials
IF5.3
err2026-05-13
err0
errOAAI
errYifan Wang; Muhammad Sakib Shahriar; Salma Soliman; Noah Vaillancourt; Lance Fernandes; Andrea Padovani; Asif Islam Khan; Md Sakib Hasan; Raisul Islam
err分享
err收藏
Enabling Radiation Hardness in Solid-State NAND Storage Utilizing a Laminated Ferroelectric Stack利用层叠铁电堆实现固态NAND存储的耐辐射性
errNano Letters
IF9.1
err2026-03-05
err0
errOAAI
errLance Fernandes; Stuart Wodzro; Prasanna Venkatesan; Priyankka Ravikumar; Ming-Yen Lee; Minji Shon; Dyutimoy Chakraborty; Taeyoung Song; Sanghyun Kang; Salma Soliman; Mengkun Tian; Jason Yeager; Jackson Adler; Jiayi Chen; Zekai Wang; Douglas Wolfe; Shimeng Yu; Andrea Padovani; Suman Datta; Biswajit Ray; Asif Khan
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Materials Design Principles for Large Memory Windows: Coercive Voltage Engineering in Ferroelectric– Dielectric Heterostructures
errAdvanced Electronic Materials
IF5.3
err2026-02-04
err0
errOAAI
errPrasanna Venkatesan; Hari Jayasankar; Salma Soliman; Priyankka Ravikumar; Lance Fernandes; Chinsung Park; Amrit Garlapati; Chengyang Zhang; Sanghyun Kang; Shimeng Yu; Suman Datta; Asif Khan; Mengkun Tian; Zheng Wang; Kijoon Kim; Kwangyou Seo; Kwangsoo Kim; Wanki Kim; Daewon Ha; Luca Larcher; Gaurav Thareja; Andrea Padovani
err分享
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ALD-Derived WO3–x Leads to Nearly Wake-Up-Free Ferroelectric Hf0.5Zr0.5O2 at Elevated TemperaturesALD衍生的WO3-x在高温下导致几乎无唤醒的铁电Hf0.5Zr0.5O2
errACS Applied Electronic Materials
IF4.7
err2026-02-04
err0
errOAAI
errNashrah Afroze; Jihoon Choi; Salma Soliman; Chang Hoon Kim; Jiayi Chen; Yu-Hsin Kuo; Mengkun Tian; Chengyang Zhang; Priyankka Gundlapudi Ravikumar; Suman Datta; Andrea Padovani; Jun Hee Lee; Asif Khan
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err收藏
Long-term reliability of naturally aged hafnium oxide ferroelectric transistors for energy-efficient embedded memory自然老化氧化铪铁电晶体管在节能嵌入式存储器中的长期可靠性
errCell Reports Physical Science
IF7.3
err2026-01-01
err1
errOAAI
errSenapati, Asim; Das, Apu; Paul, Agniva; Rana, Sk Masud; Raffel, Yannick; Olivo, Ricardo; Srivari, Padma; Kumar, Gautham; Chakrabarti, Bhaswar; Majumdar, Sayani; Padovani, Andrea; De, Sourav
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Probing Traps in Ta2O5/Al2O3 Memristive Switching Devices
errACS APPLIED ELECTRONIC MATERIALS
IF4.7
err2025-12-01
err0
PREAI
errRanjan, Alok; Padovani, Andrea; La Torraca, Paolo; Pan, Jisheng; Wang, Weijie; Song, Wendong; Bosman, Michel; Pey, Kin Leong; Raghavan, Nagarajan
err分享
err收藏
Pushing the limits of NAND technology scaling with ferroelectrics利用铁电材料推动NAND技术缩放的极限
errMRS Bulletin
IF4.9
err2025-10-06
err0
errOAAI
errPrasanna Venkatesan; Lance Fernandes; Sanghyun Kang; Priyankka Ravikumar; Taeyoung Song; Chinsung Park; Dipjyoti Das; Kijoon H. P. Kim; Kwangyou Seo; Kwangsoo Kim; Kai Ni; Andrea Padovani; Mahendra Pakala; Luca Larcher; Gaurav Thareja; Wanki Kim; Daewon Ha; Asif Khan
err分享
err收藏
Dielectric breakdown of oxide films in electronic devices (vol 9, pg 607, 2024)
errNATURE REVIEWS MATERIALS
IF86.2
err2024-10-30
err0
PREAI
errPadovani, Andrea; La Torraca, Paolo; Strand, Jack; Larcher, Luca; Shluger, Alexander L.
err分享
err收藏
Dielectric breakdown of oxide films in electronic devices电子器件中氧化膜的介电击穿
errNATURE REVIEWS MATERIALS
IF86.2
err2024-08-07
err2
PREAI
errPadovani, Andrea; La Torraca, Paolo; Strand, Jack; Larcher, Luca; Shluger, Alexander L.
err分享
err收藏
Adhesion Microscopy as a Nanoscale Probe for Oxidation and Charge Generation at Metal-Oxide Interfaces
errACS APPLIED ELECTRONIC MATERIALS
IF4.7
err2023-08-29
err2
errOAAI
errRanjan, Alok; Padovani, Andrea; Dianat, Behnood; Raghavan, Nagarajan; Pey, Kin Leong; O'Shea, Sean J.
err分享
err收藏
Molecular Bridges Link Monolayers of Hexagonal Boron Nitride during Dielectric Breakdown介电击穿过程中六方氮化硼的分子桥链接单层
errACS APPLIED ELECTRONIC MATERIALS
IF4.7
err2023-02-09
err12
errOAAI
errRanjan, Alok; O'Shea, Sesn J.; Padovani, Andrea; Su, Tong; La Torraca, Paolo; Ang, Yee Sin; Munde, Manveer Singh; Zhang, Chenhui; Zhang, Xixiang; Bosman, Michel; Raghavan, Nagarajan; Pey, Kin Leong
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err收藏
BELLO: A post-processing tool for the local-order analysis of disordered systems
errCOMPUTATIONAL MATERIALS SCIENCE
IF3.3
err2022-06-01
err2
errOAAI
errDianat, Behnood; Tavanti, Francesco; Padovani, Andrea; Larcher, Luca; Calzolari, Arrigo
err分享
err收藏
Toward Hole-Spin Qubits in Si p-MOSFETs within a Planar CMOS Foundry Technology
errPHYSICAL REVIEW APPLIED
IF4.4
err2021-11-17
err12
PREAI
errBellentani, L.; Bina, M.; Bonen, S.; Secchi, A.; Bertoni, A.; Voinigescu, S. P.; Padovani, A.; Larcher, L.; Troiani, F.
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Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory
errMATERIALS
IF3.2
err2019-10-23
err19
errOAAI
errLa Torraca, Paolo; Puglisi, Francesco Maria; Padovani, Andrea; Larcher, Luca
err分享
err收藏
Understanding the Impact of Annealing on Interface and Border Traps in the Cr/HfO2/Al2O3/MoS2 System
errACS APPLIED ELECTRONIC MATERIALS
IF4.7
err2019-06-24
err25
errOAAI
errZhao, Peng; Padovani, Andrea; Bolshakov, Pavel; Khosravi, Ava; Larcher, Luca; Hurley, Paul K.; Hinkle, Christopher L.; Wallace, Robert M.; Young, Chadwin D.
err分享
err收藏
Random telegraph noise in 2D hexagonal boron nitride dielectric films
errAPPLIED PHYSICS LETTERS
IF3.6
err2018-03-28
err24
PREAI
errRanjan, A.; Puglisi, F. M.; Raghavan, N.; O'Shea, S. J.; Shubhakar, K.; Pavan, P.; Padovani, A.; Larcher, L.; Pey, K. L.
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Bipolar Resistive RAM Based on HfO2: Physics, Compact Modeling, and Variability Control
errIEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS
IF3.8
err2016-06-01
err35
errOAAI
errPuglisi, Francesco Maria; Larcher, Luca; Padovani, Andrea; Pavan, Paolo
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err收藏
Physical Mechanisms behind the Field-Cycling Behavior of HfO2-Based Ferroelectric CapacitorsHfO2-Based铁电电容器的场循环行为背后的物理机制
errADVANCED FUNCTIONAL MATERIALS
IF19
err2016-05-06
err689
PREAI
errPesic, Milan; Fengler, Franz Paul Gustav; Larcher, Luca; Padovani, Andrea; Schenk, Tony; Grimley, Everett D.; Sang, Xiahan; LeBeau, James M.; Slesazeck, Stefan; Schroeder, Uwe; Mikolajick, Thomas
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Moving graphene devices from lab to market: advanced graphene-coated nanoprobes
errNANOSCALE
IF5.1
err2016-01-01
err33
PREAI
errHui, Fei; Vajha, Pujashree; Shi, Yuanyuan; Ji, Yanfeng; Duan, Huiling; Padovani, Andrea; Larcher, Luca; Li, Xiao Rong; Xu, Jing Juan; Lanza, Mario
err分享
err收藏

研究方向

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合作学者
合作期刊
T
Thomas Mikolajick
H 指数: 99 · 论文数: 793
R
Robert M. Wallace
H 指数: 91 · 论文数: 621
Xixiang Zhang 封面图
Xixiang Zhang (Xixiang Zhang)
H 指数: 82 · 论文数: 704
U
Uwe Schroeder
H 指数: 79 · 论文数: 337
D
Deji Akinwande
H 指数: 75 · 论文数: 490
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