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Sungho Kang

Yonsei University

22H指数
436论文数
2.4K被引数
收录论文 56
发表时间
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Deep-Learning-Based PRPG Configuration Inference for Efficient LBIST基于深度学习的PRPG配置推理以实现高效LBIST
errIEEE Transactions on Very Large Scale Integration (VLSI) Systems
IF3.1
err2026-06-18
err0
PREAI
errHanseong Cho; Jongho Park; Jaehyun Kim; Laesang Jung; Sungho Kang
err分享
err收藏
Memory-Optimized Block Compression for High-Speed Memory Testing高速内存测试的内存优化块压缩
errIEEE Transactions on Very Large Scale Integration (VLSI) Systems
IF3.1
err2026-04-28
err0
PREAI
errGyeonggyu Park; Duyeon Won; Juyong Lee; Youngki Moon; Sungho Kang
err分享
err收藏
High-Speed Redundancy Analysis for Complex Spare Structures复杂备用结构的高速冗余分析
errIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IF2.9
err2026-01-13
err0
PREAI
errYoungkwang Lee; Younwoo Yoo; Seung Ho Shin; Byungsoo Kim; Eugene Jeong; Sungho Kang
err分享
err收藏
FADE: Fault-Aware Adaptive On-Die ECC for Improving Robustness
errIEEE Transactions on Very Large Scale Integration (VLSI) Systems
IF3.1
err2025-12-10
err0
PREAI
errYoungki Moon; Juyong Lee; Nayeun Kim; Yeonho Choi; Byungsoo Kim; Sungho Kang
err分享
err收藏
STAR-PIM: Self-Test and Repair Structure for Processing-in-Memory With Adder Tree-Based MACSTAR-PIM：基于加法树MAC的存储内处理的自测试与修复结构
errieee transactions on circuits and systems i: regular papers
IF0
err2025-10-07
err0
PREAI
errSeung Ho Shin; Younwoo Yoo; Youngki Moon; Nuri Son; Dahoon Kim; Sungho Kang
err分享
err收藏
TOPS: Topology-Based Partial Scan for Stuck-At and Delay Testing
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2025-09-01
err0
PREAI
errLee, Sangjun; Park, Jongho; Joung, Jaeyoung; Kim, Jaehyun; Jung, Laesang; Kang, Sungho
err分享
err收藏
Test Cycle Reduction for TSV Test Using Streaming Scan Network on 3-D IC在3-D IC上使用流扫描网络减少TSV测试的测试周期
errIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
IF3.1
err2025-09-01
err0
PREAI
errKim, Sunghoon; Han, Donghyun; Kim, Dayoung; Kang, Sungho
err分享
err收藏
VASE: Vector Memory Using Bit-Level Address Segmentation for High-Speed Memory Testing
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2025-08-01
err0
PREAI
errLee, Sooryeong; Lee, Juyong; Lee, Hayoung; Kang, Sungho
err分享
err收藏
CLAPS: A Graph Clustering-Based Approach for Partial Scan Design
errIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IF2.9
err2025-06-04
err0
PREAI
errJaeyoung Joung; Sangjun Lee; Jongho Park; Jaehyun Kim; Laesang Jung; Sungho Kang
err分享
err收藏
The effect of different metal pad sizes on shear stress in solder ball bonding不同金属焊垫尺寸对焊球键合剪切应力的影响
errJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
IF2.8
err2025-02-20
err0
errOAAI
errKim, Kyoungrae; Kim, Yekyung; Kang, Sungho; Park, Tae Hoon
err分享
err收藏
A New Logic BIST for Complete Fault Detection Using Previous Scan-In Bit Dependency一种利用先前扫描输入位依赖关系进行完全故障检测的新逻辑BIST
errIEEE Access
IF3.6
err2025-01-01
err0
errOAAI
errJongho Park; Sangjun Lee; Jaehyun Kim; Hanseong Cho; Nayeun Kim; Sungho Kang
err分享
err收藏
An Efficient Test Scheduling Method Based on Dynamic Pairing基于动态配对的效率测试调度方法
errIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IF2.9
err2025-01-01
err0
PREAI
errHeetae Kim; Hyojoon Yun; Doohyun Yoon; Sungho Kang
err分享
err收藏
RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution
errIEEE ACCESS
IF3.6
err2025-01-01
err0
errOAAI
errYoo, Younwoo; Lee, Hayoung; Shin, Seung Ho; Kang, Sungho
err分享
err收藏
Low Cost TSV Repair Architecture Using Switch-Based Matrix for Highly Clustered Faults使用基于开关的矩阵的低成本TSV修复架构，用于高度聚集的故障
errIEEE ACCESS
IF3.6
err2025-01-01
err0
errOAAI
errJang, Seokjun; Han, Donghyun; Kim, Sunghoon; Kim, Dayoung; Kang, Sungho
err分享
err收藏
Optimizing green hydrogen systems: Balancing economic viability and reliability in the face of supply-demand volatility
errAPPLIED ENERGY
IF11
err2024-08-01
err4
PREAI
errPark, Joungho; Kang, Sungho; Kim, Sunwoo; Kim, Hana; Kim, Sang-Kyung; Lee, Jay H.
err分享
err收藏
Effect of Li addition on the precipitation behavior of AA6061 alloy
errJOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T
IF6.6
err2024-07-01
err0
errOAAI
errSon, Hyeon-Woo; Kang, Sung-Ho; Euh, Kwangjun; Lee, Yun-Soo; Kim, Kyoungdoc
err分享
err收藏
A New ISA for High-Speed and Area-Efficient ALPG
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
IF4.9
err2024-07-01
err1
PREAI
errLee, Juyong; Lee, Hayoung; Lee, Sooryeong; Kang, Sungho
err分享
err收藏
A New Zero-Overhead Test Method for Low-Power AI Accelerators一种新的低功耗AI加速器零开销测试方法
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
IF4.9
err2024-05-01
err0
PREAI
errLee, Sangjun; Park, Jongho; Park, Sungwhan; Kim, Hyemin; Kang, Sungho
err分享
err收藏
Reconfigurable Multi-Bit Scan Flip-Flop for Cell-Aware Diagnosis
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
IF4.9
err2024-04-01
err0
PREAI
errLim, Hyeonchan; Kim, Taehyun; Kang, Sungho
err分享
err收藏
TSV Built-In Self-Repair Architecture for Lifespan Reliability Enhancement of HBM
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2024-01-01
err0
PREAI
errHan, Donghyun; Won, Duyeon; Kim, Sunghoon; Kang, Sungho
err分享
err收藏

研究方向

暂无研究方向
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