Yiqiang Chen

China Electronic Product Reliability and Environmental Testing Research Institute

H指数:27

被引数:2,678

浏览量:0

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Editorial for Special Issue “High-Reliability Semiconductor Devices and Integrated Circuits, 3rd Edition”

《高可靠性半导体器件与集成电路，第三版》特刊编者按

Micromachines

IF3

2026-09-150

RF Stress-Induced Degradation Characteristics and Mechanism Analysis of AlGaN/GaN HEMTs at Different Compression Points

射频应力诱导下不同压缩点AlGaN/GaN HEMTs的退化特性及机制分析

IEEE Transactions on Electron Devices

IF3.2

2026-08-260

PRE

Simultaneously Online Monitoring and Mechanism Analysis of Package and Chip Degradation in GaN HEMTs Based on Current Transient Feature

基于电流瞬态特征的GaN HEMTs封装和芯片退化的同步在线监测与机理分析

IEEE Transactions on Power Electronics

IF6.5

2026-08-240

PRE

Design and Performance Analysis of a Novel Dual-Sheet-Beam Flat-Roofed Sine Waveguide for G-Band TWT

一种新型双片束平顶正弦波导的设计与性能分析（用于G波段行波管）

IEEE Transactions on Plasma Science

IF1.5

2026-04-010

PRE

Current Progress and Future Directions of Enzyme Technology in Food Nutrition: A Comprehensive Review of Processing, Nutrition, and Functional Innovation

Foods

IF5.1

2026-01-230

OAAI

Online Degradation Sensing and Mechanism Analysis for p-GaN HEMTs Under Repetitive ESD Stresses Based on Current Transient Feature

基于电流瞬态特征的p-GaN HEMTs在重复ESD应力下的在线退化感知与机制分析

IEEE Transactions on Power Electronics

IF6.5

2026-01-120

PRE

A Novel Rectangular Groove Sine Waveguide Slow Wave Structure for Millimeter-Wave TWT

一种新型矩形槽正弦波导慢波结构，用于毫米波TWT

IEEE TRANSACTIONS ON PLASMA SCIENCE

IF1.5

2025-10-010

PRE

Multidimensional Haptic Perception and Quantification Method for Ophthalmic Surgery Training

多维触觉感知与量化方法用于眼科手术训练

International Journal of Human–Computer Interaction

IF4.9

2025-07-310

PRE

Experimental Guideline for Fast 4D STEM Experiments Applied to Beam-Sensitive Samples

Microscopy and Microanalysis

IF3

2025-07-250

Temperature Sensitivity of Vertical Ga2O3 Junction Barrier Schottky Diode Using the p-NiO/n-Ga2O3 Heterojunction

使用p-nio/n-Ga2O3异质结的垂直Ga2O3结势垒肖特基二极管的温度敏感性

IEEE SENSORS JOURNAL

IF4.5

2025-01-010

PRE

Noncontact Time-Varying Current Reconstruction for Electromagnetic Immunity Diagnosis in Electric Vehicle Module Injection Port Testing

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS

IF7.2

2025-01-010

PRE

Modeling and Analysis of Monitoring Gate-Oxide Degradation of SiC Power MOSFETs in Circuit by the Fingerprints of Voltage Switching Transient

IEEE TRANSACTIONS ON POWER ELECTRONICS

IF6.5

2024-12-010

PRE

Electrical Properties and Reliability of AlGaN/GaN High Electron Mobility Transistor under RF Overdrive Stress at High Temperature

MICROMACHINES

IF3

2024-08-301

OAAI

Prediction of IGBT Gate Oxide Layer's Performance Degradation Based on MultiScaleFormer Network

MICROMACHINES

IF3

2024-07-300

OAAI

Converter Capacitor Temperature Estimation Based on Continued Training LSTM under Variable Load Conditions

变负载条件下基于连续训练LSTM的换流器电容温度估计

SENSORS

IF3.5

2024-07-020

OAAI

Physical insight into the abnormal VTH instability of Schottky p-GaN HEMTs under high-frequency operation

APPLIED PHYSICS LETTERS

IF3.6

2024-04-223

PRE

Influence Analysis of Asymmetric Correction Method on the Key Characteristics of the Electromagnetic Dual Probing System

IEEE SENSORS JOURNAL

IF4.5

2024-03-150

PRE

Noninvasive Flexible Current Probe as a Diagnosis Tool Inside a PWM Chopper Module

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2024-01-011

Effect of gamma irradiation on β-Ga2O3 vertical Schottky barrier diode

APPLIED PHYSICS LETTERS

IF3.6

2023-11-216

PRE

The Influence of Special Environments on SiC MOSFETs

MATERIALS

IF3.2

2023-09-131

OAAI

Yiqiang Chen

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