Jinsu Jeong - Publications, H-index & Citations

Jinsu Jeong

机构信息待补充

13H指数

49论文数

658被引数

收录论文 14

发表时间

Mitigating IR drop in ultra-high-density 3D NAND flash via channel stress modulation and material optimization

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2025-03-01

PREAI

Kim, Donghyun; Nam, Kihoon; Kim, Jiyoon; Jeong, Jinsu; Lee, Sanguk; Baek, Rock-Hyun

Accurate Evaluation of Electro-Thermal Performance in Silicon Nanosheet Field-Effect Transistors with Schemes for Controlling Parasitic Bottom Transistors

NANOMATERIALS

IF4.3

2024-06-10

OAAI

Jeong, Jinsu; Lee, Sanguk; Baek, Rock-Hyun

Neural Compact Modeling Framework for Flexible Model Parameter Selection with High Accuracy and Fast SPICE Simulation 用于高精度灵活模型参数选择和快速SPICE仿真的神经紧凑建模框架

ADVANCED INTELLIGENT SYSTEMS

IF6.1

2024-01-06

OAAI

Eom, Seungjoon; Yun, Hyeok; Jang, Hyundong; Cho, Kyeongrae; Lee, Seunghwan; Jeong, Jinsu; Baek, Rock-Hyun

Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations

IEEE ACCESS

IF3.6

2024-01-01

OAAI

Lee, Seunghwan; Eom, Seungjoon; Jeong, Jinsu; Lee, Junjong; Lee, Sanguk; Yun, Hyeok; Ahn, Yonghwan; Baek, Rock-Hyun

A Novel Source/Drain Extension Scheme with Laser-Spike Annealing for Nanosheet Field-Effect Transistors in 3D ICs

NANOMATERIALS

IF4.3

2023-02-26

OAAI

Lee, Sanguk; Jeong, Jinsu; Kang, Bohyeon; Lee, Seunghwan; Lee, Junjong; Lim, Jaewan; Hwang, Hyeonjun; Ahn, Sungmin; Baek, Rockhyun

Sensitivity of Inner Spacer Thickness Variations for Sub-3-nm Node Silicon Nanosheet Field-Effect Transistors

NANOMATERIALS

IF4.3

2022-09-26

OAAI

Lee, Sanguk; Jeong, Jinsu; Yoon, Jun-Sik; Lee, Seunghwan; Lee, Junjong; Lim, Jaewan; Baek, Rock-Hyun

Novel Modeling Approach to Analyze Threshold Voltage Variability in Short Gate-Length (15-22 nm) Nanowire FETs with Various Channel Diameters

NANOMATERIALS

IF4.3

2022-05-18

OAAI

Lee, Seunghwan; Yoon, Jun-Sik; Lee, Junjong; Jeong, Jinsu; Yun, Hyeok; Lim, Jaewan; Lee, Sanguk; Baek, Rock-Hyun

DC Performance Variations by Grain Boundary in Source/Drain Epitaxy of Sub-3-nm Nanosheet Field-Effect Transistors

IEEE ACCESS

IF3.6

2022-01-01

OAAI

Yoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Lee, Junjong; Lee, Sanguk; Lim, Jaewan; Baek, Rock-Hyun

Analysis of TSV-Induced Mechanical Stress and Electrical Noise Coupling in Sub 5-nm Node Nanosheet FETs for Heterogeneous 3D-ICs

IEEE ACCESS

IF3.6

2021-01-01

OAAI

Jeong, Jinsu; Yoon, Jun-Sik; Baek, Rock-Hyun

Monolithic 3D 6T-SRAM Based on Newly Designed Gate and Source/Drain Bottom Contact Schemes

IEEE ACCESS

IF3.6

2021-01-01

OAAI

Lee, Junjong; Yoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Lee, Sanguk; Baek, Rock-Hyun

Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application

IEEE ACCESS

IF3.6

2020-01-01

OAAI

Jeong, Jinsu; Yoon, Jun-Sik; Lee, Seunghwan; Baek, Rock-Hyun

Punch-Through-Stopper Free Nanosheet FETs With Crescent Inner-Spacer and Isolated Source/Drain

IEEE ACCESS

IF3.6

2019-01-01

OAAI

Yoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Baek, Rock-Hyun

Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node

IEEE ACCESS

IF3.6

2019-01-01

OAAI

Yoon, Jun-Sik; Lee, Seunghwan; Lee, Junjong; Jeong, Jinsu; Yun, Hyeok; Kang, Bohyeon; Baek, Rock-Hyun

Bottom oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node

IEEE ACCESS

IF3.6

2019-01-01

OAAI

Yoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Baek, Rock-Hyun

研究方向