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Seunghwan Lee

postech

17H指数
86论文数
1.1K被引数
收录论文 22
发表时间
Investigation of Dielectric Wall LER-Induced DC/AC Performance Variability in Forksheet FETs
err2025-12-04
err0
PREAI
errMinchan Kim; Seunghwan Lee; Junjong Lee; Sanguk Lee; Yonghwan Ahn; Gunryeol Cho; Rock-Hyun Baek
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Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring用于整体半导体工艺监控的神经网络的非线性变化分解
err2024-09-04
err0
errOAAI
errYun, Hyeok; Jang, Hyundong; Lee, Seunghwan; Lee, Junjong; Cho, Kyeongrae; Eom, Seungjoon; Kim, Soomin; Kim, Choong-Ki; Byun, Hong-Chul; Han, Seongjoo; Yoo, Min-Soo; Baek, Rock-Hyun
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Multi-Task Learning for Real-Time BSIM-CMG Parameter Extraction of NSFETs With Multiple Structural Variations
err2024-01-01
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errOAAI
errLee, Seunghwan; Eom, Seungjoon; Jeong, Jinsu; Lee, Junjong; Lee, Sanguk; Yun, Hyeok; Ahn, Yonghwan; Baek, Rock-Hyun
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A Novel Source/Drain Extension Scheme with Laser-Spike Annealing for Nanosheet Field-Effect Transistors in 3D ICs
err2023-02-26
err3
errOAAI
errLee, Sanguk; Jeong, Jinsu; Kang, Bohyeon; Lee, Seunghwan; Lee, Junjong; Lim, Jaewan; Hwang, Hyeonjun; Ahn, Sungmin; Baek, Rockhyun
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Sensitivity of Inner Spacer Thickness Variations for Sub-3-nm Node Silicon Nanosheet Field-Effect Transistors
err2022-09-26
err8
errOAAI
errLee, Sanguk; Jeong, Jinsu; Yoon, Jun-Sik; Lee, Seunghwan; Lee, Junjong; Lim, Jaewan; Baek, Rock-Hyun
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Novel Modeling Approach to Analyze Threshold Voltage Variability in Short Gate-Length (15-22 nm) Nanowire FETs with Various Channel Diameters
err2022-05-18
err3
errOAAI
errLee, Seunghwan; Yoon, Jun-Sik; Lee, Junjong; Jeong, Jinsu; Yun, Hyeok; Lim, Jaewan; Lee, Sanguk; Baek, Rock-Hyun
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DC Performance Variations by Grain Boundary in Source/Drain Epitaxy of Sub-3-nm Nanosheet Field-Effect Transistors
err2022-01-01
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errOAAI
errYoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Lee, Junjong; Lee, Sanguk; Lim, Jaewan; Baek, Rock-Hyun
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Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning
err2021-01-01
err22
errOAAI
errYoon, Jun-Sik; Lee, Seunghwan; Yun, Hyeok; Baek, Rock-Hyun
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Monolithic 3D 6T-SRAM Based on Newly Designed Gate and Source/Drain Bottom Contact Schemes
err2021-01-01
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errOAAI
errLee, Junjong; Yoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Lee, Sanguk; Baek, Rock-Hyun
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Punch-Through-Stopper Free Nanosheet FETs With Crescent Inner-Spacer and Isolated Source/Drain
err2019-01-01
err26
errOAAI
errYoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Baek, Rock-Hyun
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Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node
err2019-01-01
err11
errOAAI
errYoon, Jun-Sik; Lee, Seunghwan; Lee, Junjong; Jeong, Jinsu; Yun, Hyeok; Kang, Bohyeon; Baek, Rock-Hyun
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Bottom oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node
err2019-01-01
err30
errOAAI
errYoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Baek, Rock-Hyun
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