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Efficient sEMG decoding with hybrid, multi-timescale neural networks

Biomedical Signal Processing and Control

IF4.9

2026-08-13

OAAI

Andrea Ortone; Maxime Fabre; Riccardo Massa; Alberto Mazzoni; Giuseppe Desoli; Calogero Maria Oddo; Emre Neftci

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Correction: Amato et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. Sensors 2025, 25, 4218

Sensors

IF3.5

2026-08-13

OAAI

Umberto Amato; Anestis Antoniadis; Italia De Feis; Anastasiia Doinychko; Irène Gijbels; Antonino La Magna; Daniele Pagano; Francesco Piccinini; Easter Selvan Suviseshamuthu; Carlo Severgnini; Andres Torres; Patrizia Vasquez

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Conformal Growth of Stable 1T-Phase WS2 by Alkali Metal-Halide-Assisted Chemical Vapor Deposition

Crystal Growth & Design

IF0

2026-08-05

OAAI

Alessia Motta; Andrea Serafini; Paolo Targa; Davide Codegoni; Carlo Grazianetti; Christian Martella

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Combining In-Sensor Computing with Reasoning at the Edge for Low-Power Bearing RUL Prediction

Electronics

IF2.6

2026-07-23

OAAI

Simone Tognocchi; Danilo Pietro Pau; Marco Marcon

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Coupled-Lines Modeling and Design in (Bi)CMOS Technologies

IEEE Journal of Microwaves

IF4.9

2026-07-16

OAAI

João E. Gentil Lé; Jean-Daniel Arnould; Ariana L. C. Serrano; Gustavo P. Rehder; Cédric Durand; Loïc Vincent; Philippe Ferrari

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Robust Vertical Interface Design for Battery Management Systems: EMI Failure Analysis and Countermeasures

IEEE Access

IF3.6

2026-07-01

OAAI

Amirhossein Ahmadi; Claudio Serratoni; Valerio Bendotti; Paolo Vilmercati; Paolo S. Crovetti

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ArF grayscale lithography for high-volume manufacturing of submicron 3D structures

Micro and Nano Engineering

IF3.1

2026-06-29

OAAI

Gaby BÉLOT; Sébastien BÉRARD-BERGERY; Élodie SUNGAUER; Aurélien FAY; Api WARSONO; Arnaud BAZIN; Cécile GOURGON

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Physics-guided machine learning surrogate for layout optimization to reduce on-state resistance in power MOSFETs

Materials Science in Semiconductor Processing

IF4.6

2026-06-28

OAAI

Ammar Tariq; Enza Fazio; Patrik Vacula; Dalibor Bari; Valeria Cinnera Martino; Salvatore Rinaudo

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Bias-Increased Trap Emission Underlying the On-Resistance Degradation of AlGaN/GaN Technology

Electronics

IF2.6

2026-06-17

OAAI

Davide Maria Lombardo; Cristina Miccoli; Giovanni Giorgino; Marcello Cioni; Giacomo Cappellini; Hyon Ju Chauveau; Simone Strano; Maurizio Moschetti; Viviana Cerantonio; Maria Eloisa Castagna; Ferdinando Iucolano; Alessandro Chini

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p-GaN Layer Etch Engineering for Defect Reduction in 200 mm Enhanced-Mode AlGaN/GaN HEMT Processing

Electronics

IF2.6

2026-06-17

OAAI

Pauline Gaillard; Sébastien Avertin; Julien Drieu La Rochelle; Mohammed Zeghouane; Hyon-Ju Chauveau; Giovanni Giorgino; Aurore Constant; Ferdinando Iucolano

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Analytical modelling for reliable z-axis FM MEMS accelerometer

EUROPEAN JOURNAL OF MECHANICS A-SOLIDS

IF4.2

2026-06-13

PREAI

Luca Rosafalco; Gabriele Gattere; Riccardo Nastri; Giacomo Langfelder; Valentina Zega

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Sustainable AFM-Based Nanolithography on Chitosan Thin Films for 2.5D and 3D Nanostructure Fabrication

Nanomaterials

IF4.3

2026-06-11

OAAI

Lorenzo Vincenti; Isabella Farella; Mariafrancesca Cascione; Valeria De Matteis; Adriana Campa; Annalisa Bianco; Maurizio Martino; Fabio Quaranta; Alessandro Paolo Bramanti; Rosaria Rinaldi; Paolo Pellegrino

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On-Chip Diplexer at E-Band 83/95 GHz

Electronics

IF2.6

2026-06-03

OAAI

Mohammed Wehbi; Loïc Vincent; Cédric Durand; Philippe Ferrari; Hamza Issa

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Effect of electrostatic discharge on gallium nitride epitaxial defects during bevel edge polishing

Materials Science in Semiconductor Processing

IF4.6

2026-05-27

PREAI

P. Gaillard; E. Roy; J. Drieu La Rochelle; F. Boutin; V. Guillon; J. Ladroue; A. Constant; F. Iucolano

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A 28-nm FD-SOI CMOS Analog-IMC Core Based on PCM Featuring 8 512 × 512-Weight Layers and 28M Weights×TOPs/W/mm<sup>2</sup>

IEEE Journal of Solid-State Circuits

IF5.6

2026-05-22

PREAI

Marco Pasotti; Riccardo Zurla; J. J. Bertolini Agnoletto; Emanuela Calvetti; Alessio Antolini; Andrea Lico; Giuseppe Desoli; Riccardo Vignali; Luca Iannelli; Luigi Croce; Francesco Zavalloni; Eleonora Franchi Scarselli; Alessandro Cabrini

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Edge-Deployable Tabular Q-Learning Voltage Control for LLC Resonant Converters Under Dynamic Conditions

Electronics

IF2.6

2026-05-19

OAAI

Fabio Corti; Alberto Reatti; Danilo Pietro Pau

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Selective Plasma Enhanced Atomic Layer Deposition For Deep Trench Filling: A Design-Of-Experiments Approach

Chemical Engineering Research and Design

IF3.9

2026-05-15

PREAI

Martial Santorelli; Jean-Hervé Tortai; Madec Querré; Marceline Bonvalot

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A Deep Analysis on Back-Effect of Schottky p-GaN HEMTs: Impact of [Mg] and Gate Polarization

IEEE Transactions on Electron Devices

IF3.2

2026-05-04

PREAI

Giacomo Cappellini; Marcello Cioni; Alessandro Chini; Giovanni Giorgino; Maurizio Moschetti; Cristina Miccoli; Davide Maria Lombardo; Simone Strano; Santo Reina; Maria Eloisa Castagna; Ferdinando Iucolano

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Effective mobility in N-MOSFET: comparison of McLarty and split C-V methods, and the mobility degradation factors effects

Semiconductor Science and Technology

IF2.1

2026-05-01

PREAI

Masson, P.; Kubica, R. M. R.; Dahbi, S.; Bousmaha-Jouve, R.; Amouroux, J.; Dura, J.; Julien, F.; Misra, V

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Single-Event and Dose Effects in 28 nm FD-SOI Advanced Interface Bus Chiplet Interconnect

IEEE Transactions on Nuclear Science

IF1.9

2026-05-01

PREAI

Rouget, Antoine; Evans, Adrian; Abouzeid, Fady; Bascoul, Guillaume; Malherbe, Victor; Le-Bars, Gwenvael; Roche, Philippe; Clermidy, Fabien

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